Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Olga Yu Ridzel"'
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d903ba800887a1f541a65ed3ff040aab
https://doi.org/10.1117/12.2661103
https://doi.org/10.1117/12.2661103
Autor:
Vytautas Astašauskas, Gian Marco Pierantozzi, Giovanni Stefani, Wolfgang S. M. Werner, Mauro Taborelli, Alessandro Ruocco, Olga Yu. Ridzel, Alessandra Bellissimo
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena, 241
More than a century after the discovery of the electron, there are still fundamental, yet unresolved, questions concerning the generation-ejection mechanism of the ubiquitous Secondary Electrons (SEs) from a solid surface. Broadness of the field of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::254517cd7f8d5d8e0ea230f5bb2f61b9
http://cds.cern.ch/record/2800205
http://cds.cern.ch/record/2800205
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 241:146824
Since the emission of secondary electrons for any incident energy always involves the formation and emission of a cascade of slow electrons (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c8a69671e05dce1f8cbf89c44228c29
https://doi.org/10.1016/j.elspec.2019.02.003
https://doi.org/10.1016/j.elspec.2019.02.003
Autor:
Simone Taioli, Viktor P. Afanas'ev, Olga Yu. Ridzel, Maurizio Dapor, P. S. Kaplya, Nicola M. Pugno, Martina Azzolini
Publikováno v:
Computational Materials Science. 173:109420
In this work we describe two different models for interpreting and predicting Reflection Electron Energy Loss (REEL) spectra and we present results of a study on metallic systems comparing their respective computational cost and accuracy. These appro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe2e544ef5f15d54362694d18dffde19
https://doi.org/10.1016/j.commatsci.2019.109420
https://doi.org/10.1016/j.commatsci.2019.109420
Autor:
Viktor P. Afanas'ev, Olga Yu. Ridzel, Martin Köppen, Alexander V. Eletskii, P. S. Kaplya, G. S. Bocharov
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35:041804
The dynamics of graphene oxide (GO) reduction process is investigated by the electron spectroscopy. GO samples were obtained by the standard Hummers method with the subsequent thermal treatment at different temperatures. Photoelectron emission spectr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de974db48f81df569fd29b7f11d280f5
https://doi.org/10.1116/1.4994788
https://doi.org/10.1116/1.4994788