Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Oleksandr V. Pshyk"'
Publikováno v:
Advanced Materials Interfaces, Vol 11, Iss 25, Pp n/a-n/a (2024)
Abstract The crystalline quality and degree of c‐axis orientation of hexagonal AlN thin films correlate directly with their functional properties. Therefore, achieving AlN thin films of high crystalline quality and texture is of extraordinary impor
Externí odkaz:
https://doaj.org/article/01d9648e86ef47c1afdb3f6639e53c69
