Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Oleg F. Vyvenko"'
Autor:
Ksenia Yu Maksimova, Anatoly A. Kozlov, Petr V. Shvets, Ulyana Yu Koneva, Oksana V. Yurkevich, Oleg I. Lebedev, Oleg F. Vyvenko, Vladimir Yu Mikhailovskii, Aleksandr Yu Goikhman
Publikováno v:
ACS Omega, Vol 3, Iss 2, Pp 1684-1688 (2018)
Externí odkaz:
https://doaj.org/article/321a662ba7d44f448a721f76dfe480a4
Autor:
Yuri V. Petrov, Oleg F. Vyvenko
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1125-1137 (2015)
Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limit
Externí odkaz:
https://doaj.org/article/c378e6e093c2411f993dfd02c7577fad