Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Olaf Wittler"'
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Autor:
Andreas Stegmaier, Ole Hölck, Marius van Dijk, Hans Walter, Olaf Wittler, Martin Schneider-Ramelow
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publikováno v:
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Autor:
Piotr Mackowiak, Olaf Wittler, Tanja Braun, Kolia Erbacher, Michael Schiffer, Martin Schneider-Ramelow
Publikováno v:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
Autor:
Piotr Mackowiak, Olaf Wittler, Tanja Braun, Janine Conrad, Michael Schiffer, Martin Schneider-Ramelow
Publikováno v:
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC).
Autor:
Marius van Dijk, Olaf Wittler, Ping-Chi Hung, Wei-Hong Lai, Cheng-Yu Hsieh, Thomas Wang, Martin Schneider-Ramelow
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Publikováno v:
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publikováno v:
2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 10:974-981
Thermomechanical modeling of a new double-overmolded optical sensor package, comprising a highly filled, as well as an unfilled, strongly thermally expanding transfer molding compound, is presented. Materials' characterization of the polymers using t