Výsledky vyhledávání - "Olaf C. Haenssler"

Akademický článek

Amplitude-Phase Variation in a Graphene-Based Microstrip Line

Autor: Muhammad Yasir, Sergej Fatikow, Olaf C. Haenssler

Publikováno v: Micromachines, Vol 13, Iss 7, p 1039 (2022)

A graphene-based transmission line with independent amplitude and phase variation capability is proposed. Variation of graphene’s tunable conductivity by an applied DC bias is exploited in designing an attenuator and a phase shifter. The attenuator

Externí odkaz: https://doaj.org/article/5228087469e44226b9a0f28c6423c635

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Evaluation of the Systematic Error for Scanning Microwave Microscopy Following an In-Situ Broadband Calibration Procedure

Autor: Matthieu Gaudet, James Mead, Olaf C. Haenssler, Sergej Fatikow

Publikováno v: 2022 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO).

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::090ab276832124c8afd7a52843dcfad3
https://doi.org/10.1109/nemo51452.2022.10038516

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Reduction of graphene oxide and graphene quantum dots using nascent hydrogen: The investigation of morphological and structural changes

Autor: Biljana M. Todorović Marković, Olaf C. Haenssler, Milica D. Budimir, Jovana Prekodravac, Duška Kleut, Svetlana Jovanovic

Publikováno v: Resolution and Discovery. 5:1-4

In order to modify both chemical and electrical properties of graphene-based nanomaterials, we conducted the chemical modification of graphene oxide (GO) and graphene quantum dots (GQDs). The reaction of the reduction with nascent hydrogen was conduc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3d5545adccff00fb85308d354d09af42
https://doi.org/10.1556/2051.2020.00073

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Manipulation of Liquid Metal Inside an SEM by Taking Advantage of Electromigration

Autor: Olaf C. Haenssler, Fabian T. von Kleist-Retzow, Sergej Fatikow

Publikováno v: Journal of Microelectromechanical Systems. 28:88-94

We present a new technique to produce liquid metal spheres with customized diameters using electromigration. The liquid metal used is a versatile material, which is increasingly implemented in micromanipulation applications. The theories of mass tran

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::454951a1a470ea5136c57ac387d69310
https://doi.org/10.1109/jmems.2018.2878320

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Multi-target tracking for automated RF on-wafer probing based on template matching

Autor: Sergej Fatikow, Hai Li, Olaf C. Haenssler, Xianmin Zhang, Fabian T. von Kleist-Retzow

Publikováno v: 2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS).

This paper presents a vision-based multi-target tracking method for automated on-wafer RF probing. First, a visual servo control framework is introduced to automate the process of alignment for on-wafer RF probing. Second, to obtain accurate poses of

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9f62e8c96f8c85873a0140152b2a6d67
https://doi.org/10.1109/marss.2019.8860983

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Towards Robot-based Manipulation, Characterization and Automation at the Nanoscale

Autor: Sergej Fatikow, Malte Bartenwerfer, Olaf C. Haenssler

Publikováno v: 2019 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM).

Automated robot-based manipulation and characterization at the nanoscale constitutes a major challenge due to the large special and force uncertainties and the limited control options due to the lack of adequate sensor feedback information. This pape

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4915c805d969cdb64d36e314bec8aca7
https://doi.org/10.1109/icieam.2019.8742974

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Improving Acquisition Time in Scanning Microwave Microscopy by Undersampling the Scan Area

Autor: Sergej Fatikow, Olaf C. Haenssler, Markus F. Wieghaus

Publikováno v: 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS).

Scanning Microwave Microscopy (SMM) is a tool with high potential to analyze and characterize nanomaterials. A disadvantage of this technique is the scanning speed when using a Vector Network Analyzer (VNA) compared to other Scanning Probe Microscopy

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3cee76e1a9617eb304e5619aaea9df25
https://doi.org/10.1109/marss.2018.8481148

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Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy

Autor: Olaf C. Haenssler, Markus F. Wieghaus, A. Kostopoulos, Sergej Fatikow, G. Doundoulakis, Elias Aperathitis, George Kiriakidis

Publikováno v: Journal of Micro-Bio Robotics
Journal of Micro-Bio Robotics, 2018, 14 (3-4), pp.51-57. ⟨10.1007/s12213-018-0108-z⟩
Journal of Micro-Bio Robotics.
Journal of Micro-Bio Robotics., Springer, 2018, 14 (3-4), pp.51-57. ⟨10.1007/s12213-018-0108-z⟩

International audience; We report on measurement results of a test standard suitable for different microscopic modalities. These findings were obtained by a multimodal hybrid microscope, which requires various calibration methods, also in terms of it

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbf0eb1079ca53766ff6b2b7f8af562c
https://hal.science/hal-03183503

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Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

Autor: P. Polovodov, Christophe Boyaval, Nicolas Clement, Fei Wang, D. Deresmes, C. Brillard, Kamel Haddadi, S. Eliet, Olaf C. Haenssler, Didier Theron, Gilles Dambrine

Publikováno v: 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Aug 2018, Reykjavik, Iceland. pp.1-4, ⟨10.1109/NEMO.2018.8503487⟩

International audience; Near-field scanning microwave microscopy (NSMM) is a scanning probe microscopy (SPM) technique that measures the local interaction of evanescent microwaves with a sample using a sharp tip probe. The traceability in NSMM is sti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06ad7fdc1eb369b33316110cc81b02f9

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Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors

Autor: Didier Theron, Olaf C. Haenssler, Sergej Fatikow

Publikováno v: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, AVS through the American Institute of Physics, 2018, 36 (2), pp.022901. ⟨10.1116/1.5006161⟩

Extracting simultaneously multimodal nanoscale specimen information, by an integrated microscopy technology, is in the focus of this report. The combination of multiple imaging techniques allows for obtaining complementary and often unique datasets o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::49748a67214bd7371a841ee1502d1494
https://hal.science/hal-03022536/document

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