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pro vyhledávání: '"Oiwake, Kohei"'
Autor:
Maeda, Sara, Oiwake, Kohei, Nishigaki, Yukinori, Miyadera, Tetsuhiko, Chikamatsu, Masayuki, Nagai, Takayuki, Aizawa, Takuma, Hanzawa, Kota, Hiramatsu, Hidenori, Hosono, Hideo, Fujiwara, Hiroyuki
One significant drawback of a spectroscopic ellipsometry (SE) technique is its time-consuming and often complicated analysis procedure necessary to assess the optical functions of thin-film and bulk samples. Here, to solve this inherent problem of a
Externí odkaz:
http://arxiv.org/abs/2205.05833
Publikováno v:
Journal of Applied Physics 129 (2021) 243102
In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by generally assuming dielectric function and optical models. This ellipsometry analysis, which typically requires numerous model parameters, has essentially b
Externí odkaz:
http://arxiv.org/abs/2103.16123
Autor:
Maeda, Sara, Tani, Yusuke, Katayama, Hirotaka, Kanematsu, Daiji, Oiwake, Kohei, Nishigaki, Yukinori, Miyadera, Tetsuhiko, Chikamatsu, Masayuki, Nagai, Takayuki, Aizawa, Takuma, Hanzawa, Kota, Hiramatsu, Hidenori, Terakawa, Akira, Hosono, Hideo, Fujiwara, Hiroyuki
Publikováno v:
In Thin Solid Films 31 December 2023 787
Akademický článek
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