Zobrazeno 1 - 10
of 101
pro vyhledávání: '"Ohmyoung, Kwon"'
Publikováno v:
Nanoscale and Microscale Thermophysical Engineering. 23:334-347
Rebuilding phonon mean free path (MFP) spectra from experimental data is integral to phonon MFP spectroscopy. However, being based on effective thermal conductivity, the current integral eq...
Publikováno v:
International Journal of Thermal Sciences. 172:107268
Null-point scanning thermal microscopy (NP SThM) quantitatively measures undisturbed temperature without the influence of changes in physical properties and surface topography of the specimen. Simultaneously NP SThM measures the ratio of the sum of t
Autor:
Jong-Soo Rhyee, Ohmyoung Kwon, Bong Seo Kim, R. Lydia, Jaywan Chung, Chan Chieh Lin, Yoo Jang Song, Su Dong Park
Publikováno v:
Journal of Alloys and Compounds. 708:1018-1025
We investigated anisotropic thermoelectric properties of p-type AgxBi0.5Sb1.5−xTe3−x ( x = 0.0, 0.1, 0.2 and 0.3) compounds, prepared by melting and hot press sintering. During hot press sintering and annealing process, the eutectoid decompositio
Autor:
Ohmyoung Kwon, Gwangseok Hwang
Publikováno v:
International Journal of Thermal Sciences. 108:81-88
With the rapid reduction in the characteristic length of electronic devices down to tens of nanometers in recent times, the characterization of self-heating in nanotransistors fabricated on silicon-on-insulator (SOI) substrates has become a major cha
Autor:
Ohmyoung Kwon, Gwangseok Hwang
Publikováno v:
Nanoscale. 8:5280-5290
Using null-point scanning thermal microscopy (NP SThM), we have measured and analyzed the size dependence of the thermal conductivity of graphene. To do so, we rigorously re-derived the principal equation of NP SThM in terms of thermal property measu
Publikováno v:
Journal of Nanoscience and Nanotechnology. 15:9077-9082
In the development of graphene-based electronic devices, it is crucial to characterize the thermal contact resistance between the graphene and the substrate precisely. In this study, we demonstrate that the thermal contact resistance between CVD-grow
Publikováno v:
Transactions of the Korean Society of Mechanical Engineers B. 38:957-962
We present a method to quantitatively measure the thermal conductivity of one-dimensional nanostructures by utilizing scanning thermal wave microscopy (STWM) at a nanoscale spatial resolution. In this paper, we explain the principle for measuring the
Autor:
Gwangseok Hwang, Hong Goo Kim, Jaehun Chung, Joon Sik Lee, Kichul Yoon, Ohmyoung Kwon, Kenneth D. Kihm
Publikováno v:
Carbon. 76:77-83
Despite the importance of the accurate measurement of the thermal conductivity of graphene, deviations in previous data are still quite large due to the low signal-to-noise ratio in the measurement of graphene temperature, the uncertainties in the me
Autor:
Ohmyoung Kwon, Kyeongtae Kim
Publikováno v:
High Temperatures-High Pressures. 48:71
Autor:
Ohmyoung Kwon1 omkwon@korea.ac.kr, Majumdar, Arun1
Publikováno v:
Microscale Thermophysical Engineering. Oct-Dec2003, Vol. 7 Issue 4, p349-354. 6p.