Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Oh, Sunghyun"'
Autor:
Jeong, Kwiwan, Kim, Jinhee, Chang, JuOae, Hong, Subin, Kim, Inseo, Oh, Sunghyun, Jeon, Sangeun, Lee, Joo Chan, Park, Hyun-Ju, Kim, Seungtaek, Lee, Wonsik
Publikováno v:
In iScience 21 October 2022 25(10)
Publikováno v:
2011 6th International Conference on Computer Sciences & Convergence Information Technology (ICCIT); 1/ 1/2011, p759-762, 4p
Publikováno v:
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p70281O-70281O-8, 8p
Publikováno v:
Proceedings of SPIE; Nov2008, Issue 1, p692123-692123-8, 8p
Publikováno v:
Proceedings of SPIE; Nov2007, Issue 1, p673029-673029-9, 9p
Publikováno v:
Proceedings of SPIE; Nov2006 Part 2, Issue 1, p63491N-63491N-8, 8p
Autor:
Kim, Munsik, Lee, Hyemi, Seo, Kanjoon, Lee, Dongwook, Choi, Yongkyoo, Oh, Sunghyun, Han, Oscar
Publikováno v:
Proceedings of SPIE; Nov2006, Issue 1, p634944-634944-9, 9p
Autor:
Hayashi, Naoya, Kasprowicz, Bryan S., Jo, Sangjin, Choi, Chungseon, Oh, Sunghyun, Ha, Taejoong, Lee, Youngmo, Kim, Sangpyo, Yim, Donggyu
Publikováno v:
Proceedings of SPIE; October 2015, Vol. 9635 Issue: 1 p96351T-96351T-6, 867166p
Analysis of phase defect effect on contact hole pattern using a programmed phase defect in EUVL mask
Autor:
Wood, Obert R., Panning, Eric M., Kim, Yongdae, Terasawa, Tsuneo, Amano, Tsuyoshi, Oh, Sunghyun, Hyun, Yoonsuk, Watanabe, Hidehiro
Publikováno v:
Proceedings of SPIE; April 2014, Vol. 9048 Issue: 1 p90482Q-90482Q-9, 814348p
Autor:
Naulleau, Patrick P., Terasawa, Tsuneo, Amano, Tsuyoshi, Oh, Sunghyun, Yamane, Takeshi, Watanabe, Hidehiro
Publikováno v:
Proceedings of SPIE; April 2013, Vol. 8679 Issue: 1 p86791B-86791B-8, 781128p