Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Oguzhan Gurlu"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 2953-2959 (2018)
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images of graphene reveal either a triangular or honeycomb pattern at the atomic scale depending on the imaging parameters. The triangular patterns at the atomic scale are particul
Externí odkaz:
https://doaj.org/article/b5ce092cf15b45fcb7d475e8bcdee56b
Autor:
Oguzhan Gurlu, Gabriele Bertolini, Robin Pröbsting, D. Westholm, J. Wei, M. Schnedler, Urs Ramsperger, John P. Xanthakis, Rafal E. Dunin-Borkowski, Danilo Pescia, H. Cabrera, D. A. Zanin
Publikováno v:
Royal Society Open Science
Royal Society Open Science, Vol 8, Iss 7 (2021)
Royal Society Open Science 8(7), 210511-(2021). doi:10.1098/rsos.210511
Royal Society Open Science, 8 (7)
Royal Society Open Science, Vol 8, Iss 7 (2021)
Royal Society Open Science 8(7), 210511-(2021). doi:10.1098/rsos.210511
Royal Society Open Science, 8 (7)
In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin et al. 2016 Proc. R. Soc. A472,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8b9fd3482aa3bcc47b50fec3b8555e9c
https://pubmed.ncbi.nlm.nih.gov/34295530
https://pubmed.ncbi.nlm.nih.gov/34295530
Publikováno v:
2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
Scanning Tunneling Microscopy is performed in the conventional (tunneling) and in the field-emission regime. Images of W(110)-surfaces with and without some carbon content are taken in the constant current mode, in which the tip-target vertical dista
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d31850a697b285b0a010d8f1bf09d37f
https://doi.org/10.1109/ivnc49440.2020.9203360
https://doi.org/10.1109/ivnc49440.2020.9203360
Autor:
C. G. H. Walker, Cem Kincal, Umut Kamber, Ashish Suri, Oguzhan Gurlu, Andrew Pratt, Mohamed M. El-Gomati, S. P. Tear
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena, 241
The interpretation of images generated by scanning electron microscopes (SEMs) requires quantifiable and well-understood contrast. Furthermore, recent interest in probing samples using low-energy electrons to extract surface information is pushing to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57ee1722fa0669976e44c9d83ee31eae
https://hdl.handle.net/20.500.11850/424334
https://hdl.handle.net/20.500.11850/424334
Corrosion and wear protection of metals are crucial for all industrial applications. Graphene oxide (GO) is a chemically modified form of graphene and is highly promising for corrosion inhibition. Although corrosion protection of metal surfaces by th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d333a61ffa378d1a65dfdcb83868f1e5
https://aperta.ulakbim.gov.tr/record/4995
https://aperta.ulakbim.gov.tr/record/4995
Publikováno v:
Nature Materials
Joule energy loss due to resistive heating is omnipresent in today's electronic devices whereas quantum-mechanical dissipation is largely unexplored. Here, we experimentally observe a suppression of the Joule dissipation in Bi2Te3 due to topologicall
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4385c6bd17c4fa1c2b78d2fec8474013
https://aperta.ulakbim.gov.tr/record/68929
https://aperta.ulakbim.gov.tr/record/68929
Autor:
Oguzhan Gurlu, Dilek Yildiz
Publikováno v:
Materials Today Communications. 8:72-78
Many different moire patterns were reported on highly oriented pyrolytic graphite (HOPG) surfaces in scanning tunneling microscopy (STM) studies. Such observations were attributed to the dislocation of the top most graphene layers of the crystal with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3efeb07cc214c2a3b19457eb1f35cf89
https://doi.org/10.1016/j.mtcomm.2016.06.002
https://doi.org/10.1016/j.mtcomm.2016.06.002
Autor:
H. Cabrera, L. G. De Pietro, Gabriele Bertolini, Oguzhan Gurlu, Th. Bähler, Urs Ramsperger, Danilo Pescia
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 241:146865
In the Fowler-Nordheim regime of Scanning Tunneling Microscopy (STM) the tip-target distance is few nanometers to few tens of nanometers. In this situation the tunneling between tip and target is completely suppressed. Instead, electrons can be field
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af9324fb3629f1cce07712aa3465500a
https://doi.org/10.1016/j.elspec.2019.05.014
https://doi.org/10.1016/j.elspec.2019.05.014
Autor:
H. Cabrera, Oguzhan Gurlu, Gabriele Bertolini, Alessandro Vindigni, Urs Ramsperger, J. Zhou, Danilo Pescia, L. G. De Pietro
Publikováno v:
2018 31st International Vacuum Nanoelectronics Conference (IVNC)
Secondary electrons emitted from a scanning fieldemission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fda4e2824de4bdf56b0872a28d2d885b
https://doi.org/10.1109/ivnc.2018.8520178
https://doi.org/10.1109/ivnc.2018.8520178
Autor:
Gabriele Bertolini, Danilo Pescia, Oguzhan Gurlu, Ashish Suri, C. G. H. Walker, Alessandra Bellissimo
Publikováno v:
Journal of Surface Analysis. 26:150-151
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e8933ccd2a32fd19c12b81e0c5d9567
https://doi.org/10.1384/jsa.26.150
https://doi.org/10.1384/jsa.26.150