Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Odinets, V."'
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 3, Pp 44-49 (2011)
Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measure
Externí odkaz:
https://doaj.org/article/eb18dab746624330925a43260dd8228c
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 6, Pp 60-64 (2008)
On the basis of theoretical research an algorithm was received, allowing to calculate the features of X-ray radiation: spectral resolution, mean photon energy, homogeneity coefficient, the first and the second half-value layer by means of building a
Externí odkaz:
https://doaj.org/article/2d9dcae423d1480a852607e3a0fe06e1
Publikováno v:
Measurement Techniques; Mar1995, Vol. 38 Issue 3, p300-303, 4p
Publikováno v:
Bulletin of the Academy of Sciences of The USSR, Division of Chemical Science; 1961, Vol. 10 Issue 9, p1507-1514, 8p
Autor:
Andrianov, K., Odinets, V.
Publikováno v:
Bulletin of the Academy of Sciences of The USSR, Division of Chemical Science; 1959, Vol. 8 Issue 3, p435-439, 5p
Autor:
Andrianov, K., Odinets, V.
Publikováno v:
Bulletin of the Academy of Sciences of The USSR, Division of Chemical Science; 1957, Vol. 6 Issue 8, p988-993, 6p
Autor:
Andrianov, K., Odinets, V.
Publikováno v:
Bulletin of the Academy of Sciences of The USSR, Division of Chemical Science; 1957, Vol. 6 Issue 6, p699-706, 8p
Publikováno v:
Bulletin of the Academy of Sciences of The USSR, Division of Chemical Science; 1971, Vol. 20 Issue 10, p2114-2117, 4p