Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Odilia Coi"'
Autor:
Richard Foster-Fletcher, Odilia Coi
Publikováno v:
Applied Ethics in a Digital World ISBN: 9781799884675
Applied Ethics in a Digital World
Applied Ethics in a Digital World
Social media is a mega-industry built by systematically monetizing the exploitation of human emotions, reactions, and biases. The authors explain how this industry became so profitable by creating a fear of missing out (FOMO) to command our attention
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c670310d4052f11b201ad01a8b83e6e6
https://doi.org/10.4018/978-1-7998-8467-5.ch010
https://doi.org/10.4018/978-1-7998-8467-5.ch010
Publikováno v:
RADECS 2021-21th European Conference on Radiation and its Effects on Components and Systems
RADECS 2021-21th European Conference on Radiation and its Effects on Components and Systems, Sep 2021, Vienna, Austria. pp.1-5, ⟨10.1109/RADECS53308.2021.9954501⟩
Radiation and its Effects on Components and Systems (RADECS 2021)
Radiation and its Effects on Components and Systems (RADECS 2021), Sep 2021, Vienna, Austria
HAL
RADECS 2021-21th European Conference on Radiation and its Effects on Components and Systems, Sep 2021, Vienna, Austria. pp.1-5, ⟨10.1109/RADECS53308.2021.9954501⟩
Radiation and its Effects on Components and Systems (RADECS 2021)
Radiation and its Effects on Components and Systems (RADECS 2021), Sep 2021, Vienna, Austria
HAL
International audience; This paper aims to investigate proton irradiation effects on a new class of emerging devices: Perpendicular-Magnetic Anysotropy (PMA) Spin Orbit (SOT) Torque Magnetic Tunnel Junctions (MTJ).
Autor:
Robert Ecoffet, Ricardo C. Sousa, Odilia Coi, Gregory Di Pendina, Nomena Adrianjohany, David Dangla, Lionel Torres
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.588-596. ⟨10.1109/TNS.2021.3071257⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.588-596. ⟨10.1109/TNS.2021.3071257⟩
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.588-596. ⟨10.1109/TNS.2021.3071257⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (5), pp.588-596. ⟨10.1109/TNS.2021.3071257⟩
International audience; This paper investigates laser and heavy ion irradiation effects on Perpendicular Magnetic Anisotropy Spin Transfer Torque Magnetic Tunnel Junction devices (PMA STT-MTJ). The Radiative campaign will take place at the Universit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::443961a5096412fb58190b38e93ea54b
https://hal.science/hal-03255402
https://hal.science/hal-03255402
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1674-1681. ⟨10.1109/TNS.2020.3002649⟩
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1674-1681. ⟨10.1109/TNS.2020.3002649⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1674-1681. ⟨10.1109/TNS.2020.3002649⟩
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1674-1681. ⟨10.1109/TNS.2020.3002649⟩
International audience; For embedded systems in harsh environments, a radiation robust circuit design is still an open challenge. As complementary-metal-oxide semiconductor (CMOS) processes get denser and smaller, their immunity toward particle strik
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::766b4048f7a334d19daa44525d5c3d51
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957089/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957089/document
Autor:
Bernard Dieny, Gregory Di Pendina, David Dangla, Robert Ecoffet, Nomena Adrianjohany, Lionel Torres, Odilia Coi
Publikováno v:
HAL
RADECS 2020
RADECS 2020, Oct 2020, ONLINE, France
RADECS 2020-20th European Conference on Radiation and its Effects on Components and Systems
RADECS 2020-20th European Conference on Radiation and its Effects on Components and Systems, Oct 2020, Online, France
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (8), pp.1533-1541. ⟨10.1109/TNS.2021.3080080⟩
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1533-1541. ⟨10.1109/TNS.2021.3080080⟩
RADECS 2020
RADECS 2020, Oct 2020, ONLINE, France
RADECS 2020-20th European Conference on Radiation and its Effects on Components and Systems
RADECS 2020-20th European Conference on Radiation and its Effects on Components and Systems, Oct 2020, Online, France
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (8), pp.1533-1541. ⟨10.1109/TNS.2021.3080080⟩
IEEE Transactions on Nuclear Science, 2021, 68 (8), pp.1533-1541. ⟨10.1109/TNS.2021.3080080⟩
International audience; The paper investigates radiation-induced switching mechanisms, temperature effects, breakdown voltage, sensitive volume and critical charge definitions for Spin-Transfer Torque Magnetic Tunnel Junction. Thermal spike model is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66f97cdc52b93fec80db5f3131093f14
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957096
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957096
Publikováno v:
21ème Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM)
21ème Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2019, Montpellier, France
HAL
21ème Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM), Jun 2019, Montpellier, France
HAL
National audience; For embedded systems in harsh environments, a radiation robust circuit design is still an open challenge. As circuits become more and more complex and CMOS processes get denser and smaller, their immunity towards particle strikes d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ffa675fa2bccb8aa1903ec042661f09c
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02366116/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02366116/document
Publikováno v:
IEEE/ACM International Conference on Nanoscale Architectures
NANOARCH: Nanoscale Architectures
NANOARCH: Nanoscale Architectures, Jul 2017, Newport, United States. pp.39-44, ⟨10.1109/NANOARCH.2017.8053704⟩
NANOARCH
2017 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)
NANOARCH: Nanoscale Architectures
NANOARCH: Nanoscale Architectures, Jul 2017, Newport, United States. pp.39-44, ⟨10.1109/NANOARCH.2017.8053704⟩
NANOARCH
2017 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)
International audience; Memories are currently a real bottleneck to design high speed and energy-efficient systems-on-chip. A significant increase of the performance gap between processors and memories is observed. On the other hand, an important pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::90afca4bc46aad987dfbfdc5ca150450
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01548938
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01548938
Autor:
Gilles Sassatelli, Sophiane Senni, Lionel Torres, Pascal Benoit, Pierre-Yves Péneau, Odilia Coi, Abdoulaye Gamatié, Thibaud Delobelle
Publikováno v:
IEEE DATE 2017 Conference
20th Conference & Exhibition of Design, Automation & Test in Europe
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2017, Lausanne, Switzerland. pp.536-541, ⟨10.23919/DATE.2017.7927046⟩
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
DATE
20th Conference & Exhibition of Design, Automation & Test in Europe
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2017, Lausanne, Switzerland. pp.536-541, ⟨10.23919/DATE.2017.7927046⟩
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
DATE
International audience; The scaling limits of CMOS have pushed many researchers to explore alternative technologies for beyond CMOS circuits. In addition to the increased device variability and process complexity led by the continuous decreasing size
Publikováno v:
HAL
RADECS 2019-30th European Conference on Radiation and Its Effects on Components and Systems
RADECS 2019-30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
30th European Conference on Radiation and its Effects on Components and Systems (RADECS)
30th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2019, Montpellier, France
RADECS 2019-30th European Conference on Radiation and Its Effects on Components and Systems
RADECS 2019-30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
30th European Conference on Radiation and its Effects on Components and Systems (RADECS)
30th European Conference on Radiation and its Effects on Components and Systems (RADECS), Sep 2019, Montpellier, France
International audience; For embedded systems in harsh environments, a ra- diation robust circuit design is still an open challenge. As circuits become more and more complex and CMOS processes get denser and smaller, their immunity to- wards particle
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dca4d48b905ecd4fd763263ba82443d4
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957093
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02957093