Zobrazeno 1 - 10
of 62
pro vyhledávání: '"Oden L. Warren"'
Autor:
Sören Kaps, Sanjit Bhowmick, Jorit Gröttrup, Viktor Hrkac, Douglas Stauffer, Hua Guo, Oden L. Warren, Jost Adam, Lorenz Kienle, Andrew M. Minor, Rainer Adelung, Yogendra Kumar Mishra
Publikováno v:
ACS Omega, Vol 2, Iss 6, Pp 2985-2993 (2017)
Externí odkaz:
https://doaj.org/article/5194da8150a047349fec84ece065f958
Publikováno v:
Philosophical Magazine. 95:1945-1966
Fracture toughness measurements at the small scale have gained prominence over the years due to the continuing miniaturization of structural systems. Measurements carried out on bulk materials cannot be extrapolated to smaller length scales either du
Autor:
Jodie Bradby, Ryan Major, Simon Ruffell, Oden L. Warren, David J. Sprouster, Douglas Stauffer, James Williams
Publikováno v:
Acta Materialia. 71:153-163
The electromechanical properties of metallic and semiconductor materials are investigated in situ using hard, electrically conductive, vanadium carbide Berkovich tips fitted to a nanoindenter. We demonstrate that, for tip contact radii from 100 nm up
Autor:
Jason Oh, Andrew M. Minor, Hongbin Bei, Claire Chisholm, M. B. Lowry, Oden L. Warren, Zhi-Wei Shan, Easo P. George, S. A. Syed Asif
Publikováno v:
Acta Materialia. 60:2258-2264
The evolution of defects in Mo alloy nanofibers with initial dislocation densities ranging from 0 to ∼1.6 × 10 14 m −2 were studied using an in situ “push-to-pull” device in conjunction with a nanoindenter in a transmission electron microsco
Autor:
Ryan Major, Jodie Bradby, Mark Lockrey, James Williams, Simon Ruffell, David J. Sprouster, Matthew R. Phillips, Oden L. Warren
Publikováno v:
Journal of Materials Research. 26:3051-3057
We report on the electrical and structural properties of boron-doped diamond tips commonly used for in-situ electromechanical testing during nanoindentation. The boron dopant environment, as evidenced by cathodoluminescence (CL) microscopy, revealed
Autor:
Hua Guo, Andrew M. Minor, Kevin Wang, Yunje Oh, Oden L. Warren, Junqiao Wu, Zhi-Wei Shan, Catherine Dejoie, S. A. Syed Asif, Kai Chen
Publikováno v:
Nano Letters. 11:3207-3213
The elastic properties and structural phase transitions of individual VO2 nanowires were studied using an in situ push-to-pull microelectromechanical device to realize quantitative tensile analysis in a transmission electron microscope and a synchrot
Publikováno v:
MRS Bulletin. 33:1168-1173
For many years, a fundamental problem in contact mechanics, both tribology and indentation problems, has been the inability to see what is taking place—the buried-interface problem. Over the past few years, there have been developments whereby it h
Autor:
Andrew M. Minor, A. P. Alivisatos, G. Adesso, Andreu Cabot, M. P. Sherburne, Zhi-Wei Shan, Oden L. Warren, Daryl C. Chrzan, S. A. Syed Asif
Publikováno v:
Nature Materials. 7:947-952
Nanocrystalline materials offer very high strength but are typically limited in their strain to failure, and efforts to improve deformability in these materials are usually found to be at the expense of strength. Using a combination of quantitative i
Publikováno v:
Microscopy Today. 16:34-37
Testing the mechanical properties of nanoscale materials faces a number of inherent challenges. As the size of the “target” decreases, the inability to actually see what occurs during testing can be troublesome. While a number of studies have att
Autor:
Ryan Major, G. Buerki, Oden L. Warren, Edward Cyrankowski, J. Michler, S. A. Syed Asif, Karolina Rzepiejewska-Malyska
Publikováno v:
Journal of Materials Research. 23:1973-1979
In nanoindentation, the occurrence of cracks, pileup, sink-in, or film delamination adds additional complexity to the analysis of the load–displacement curves. Many techniques and analysis methods have been used to extract both qualitative and quan