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pro vyhledávání: '"Octon, Tobias J."'
Autor:
Amit, Iddo, Octon, Tobias J., Townsend, Nicola J., Reale, Francesco, Wright, C. David, Mattevi, Cecilia, Craciun, Monica F., Russo, Saverio
Publikováno v:
Advanced Materials Early View (2017), 1605598
Transient currents in atomically thin MoTe$_2$ field-effect transistor are measured during cycles of pulses through the gate electrode. The transients are analyzed in light of a newly proposed model for charge trapping dynamics that renders a time-de
Externí odkaz:
http://arxiv.org/abs/1703.05678
Akademický článek
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Autor:
Octon, Tobias J., Nagareddy, V. Karthik, Russo, Saverio, Craciun, Monica F., Wright, C. David
Publikováno v:
Advanced Optical Materials; Nov2016, Vol. 4 Issue 11, p1750-1754, 5p
Autor:
Amit, Iddo, Octon, Tobias J., Townsend, Nicola J., Reale, Francesco, Wright, C. David, Mattevi, Cecilia, Craciun, Monica F., Russo, Saverio
Publikováno v:
Advanced materials, 2017, Vol.29(19), pp.1605598 [Peer Reviewed Journal]
Transient currents in atomically thin MoTe$_2$ field-effect transistor are measured during cycles of pulses through the gate electrode. The transients are analyzed in light of a newly proposed model for charge trapping dynamics that renders a time-de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d72f5fec600126718e1834818abeead9