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pro vyhledávání: '"Obulesu, Battari"'
Autor:
Obulesu, Battari, Dwaraka Praveena, Hirald, Javid Basha, Shaik, Sruthi, M.V., Sunil Kumar, K., Ashokkumar, N.
Publikováno v:
In Materials Today: Proceedings
Autor:
Obulesu Battari, Ashok P., Rajesh J., Madhu K., Rakesh G., Raghava Sarath Chandra Reddy Guddety
Publikováno v:
E3S Web of Conferences, Vol 540, p 14001 (2024)
One of the biggest issues with VLSI connections is crosstalk, which is caused by coupling capacitance. Crosstalk reduces operation performance during switching activities and produces undesired output. Noise level rises as switching frequency does as
Externí odkaz:
https://doaj.org/article/b5c07ce7f665445fbb8320bb2249ebe5
Publikováno v:
International Journal of Intelligent Engineering & Systems; 2018, Vol. 11 Issue 5, p125-139, 15p