Zobrazeno 1 - 10
of 71
pro vyhledávání: '"Oates, T.W.H."'
Publikováno v:
In Thin Solid Films 30 October 2016 617 Part A:33-37
Autor:
Oates, T.W.H., Ryves, L., Burgmann, F.A., Abendroth, B., Bilek, M.M.M., McKenzie, D.R., McCulloch, D.G.
Publikováno v:
In Diamond & Related Materials 2005 14(8):1395-1401
Publikováno v:
In Sensors & Actuators: B. Chemical 2005 109(1):146-152
Autor:
Ryves, L. *, Bilek, M.M.M., Oates, T.W.H., Tarrant, R.N., McKenzie, D.R., Burgmann, F.A., McCulloch, D.G.
Publikováno v:
In Thin Solid Films 2005 482(1):133-137
Publikováno v:
In Thin Solid Films 2005 482(1):69-73
Publikováno v:
In Surface & Coatings Technology 2002 156(1):332-337
Publikováno v:
In Surface & Coatings Technology 2002 156(1):110-114
Publikováno v:
Ellipsometry Workshop 2013
STARTPAGE=88;ENDPAGE=88;TITLE=7th Workshop Ellipsometry 2012
STARTPAGE=88;ENDPAGE=88;TITLE=7th Workshop Ellipsometry 2012
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::778fbc8e52e0aa82040c0681e232d912
https://research.utwente.nl/en/publications/anisotropic-response-from-a-textured-fourfold-symmetric-substrate(d1d04bad-e242-4e83-b9a6-8afd9cfce235).html
https://research.utwente.nl/en/publications/anisotropic-response-from-a-textured-fourfold-symmetric-substrate(d1d04bad-e242-4e83-b9a6-8afd9cfce235).html
Publikováno v:
Ellipsometry at the Nanoscale
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=narcis______::f200ad1b93d6a1db928c92c36961157c
https://research.utwente.nl/en/publications/58e883c3-ea63-45f9-b4c8-abf15c18bec2
https://research.utwente.nl/en/publications/58e883c3-ea63-45f9-b4c8-abf15c18bec2