Zobrazeno 1 - 10
of 1 006
pro vyhledávání: '"OXLEY, MARK"'
Autor:
Wang, Xiao, Tsaris, Aristeidis, Mukherjee, Debangshu, Wahib, Mohamed, Chen, Peng, Oxley, Mark, Ovchinnikova, Olga, Hinkle, Jacob
Publikováno v:
Proceedings of the SC 22. IEEE Press, Article 8, 1-13 (2022)
Ptychography is a popular microscopic imaging modality for many scientific discoveries and sets the record for highest image resolution. Unfortunately, the high image resolution for ptychographic reconstruction requires significant amount of memory a
Externí odkaz:
http://arxiv.org/abs/2205.06327
Automated experiments in 4D Scanning Transmission Electron Microscopy are implemented for rapid discovery of local structures, symmetry-breaking distortions, and internal electric and magnetic fields in complex materials. Deep kernel learning enables
Externí odkaz:
http://arxiv.org/abs/2112.04479
Autor:
Roccapriore, Kevin M., Huang, Nan, Oxley, Mark P., Sharma, Vinit, Taylor, Timothy, Acharya, Swagata, Pashov, Dimitar, Katsnelson, Mikhail I., Mandrus, David, Musfeldt, Janice L., Kalinin, Sergei V.
Ordered mesoscale structures in 2D materials induced by small misorientations have opened pathways for a wide variety of novel electronic, ferroelectric, and quantum phenomena. Until now, the only mechanism to induce this periodic ordering was via me
Externí odkaz:
http://arxiv.org/abs/2110.01568
Autor:
Ghosh, Ayana, Nelson, Christopher T., Oxley, Mark, Zhang, Xiaohang, Ziatdinov, Maxim, Takeuchi, Ichiro, Kalinin, Sergei V.
Over the last decade, scanning transmission electron microscopy (STEM) has emerged as a powerful tool for probing atomic structures of complex materials with picometer precision, opening the pathway toward exploring ferroelectric, ferroelastic, and c
Externí odkaz:
http://arxiv.org/abs/2102.12678
Autor:
Kalinin, Sergei V., Oxley, Mark P., Valleti, Mani, Zhang, Junjie, Hermann, Raphael P., Zheng, Hong, Zhang, Wenrui, Eres, Gyula, Vasudevan, Rama K., Ziatdinov, Maxim
The advent of high-resolution electron and scanning probe microscopy imaging has opened the floodgates for acquiring atomically resolved images of bulk materials, 2D materials, and surfaces. This plethora of data contains an immense volume of informa
Externí odkaz:
http://arxiv.org/abs/2012.07134
Autor:
Oxley, Mark P., Ziatdinov, Maxim, Dyck, Ondrej, Lupini, Andrew R., Vasudevan, Rama, Kalinin, Sergei V.
The 4D scanning transmission electron microscopy (STEM) method has enabled mapping of the structure and functionality of solids on the atomic scale, yielding information-rich data sets containing information on the interatomic electric and magnetic f
Externí odkaz:
http://arxiv.org/abs/2009.10758
Autor:
Oxley, Mark P., Yin, Junqi, Borodinov, Nikolay, Somnath, Suhas, Ziatdinov, Maxim, Lupini, Andrew R., Jesse, Stephen, Vasudevan, Rama K., Kalinin, Sergei V.
Interface structures in complex oxides remain one of the active areas of condensed matter physics research, largely enabled by recent advances in scanning transmission electron microscopy (STEM). Yet the nature of the STEM contrast in which the struc
Externí odkaz:
http://arxiv.org/abs/2002.09039
Autor:
Zachman, Michael J., Serov, Alexey, Lyu, Xiang, McKinney, Samuel, Yu, Haoran, Oxley, Mark P., Spillane, Liam, Holby, Edward F., Cullen, David A.
Publikováno v:
In Electrochimica Acta 20 November 2023 469
Publikováno v:
Phys. Rev. E 100, 023308, 2019
Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly accelerated this pr
Externí odkaz:
http://arxiv.org/abs/1908.00659
Autor:
Li, Xin, Dyck, Ondrej E., Oxley, Mark P., Lupini, Andrew R., McInnes, Leland, Healy, John, Jesse, Stephen, Kalinin, Sergei V.
Publikováno v:
npj Computational Materials volume 5, Article number: 5 (2019)
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient processing
Externí odkaz:
http://arxiv.org/abs/1811.00080