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Autor:
O.L. Golubev
Publikováno v:
Journal de Physique IV Proceedings
Journal de Physique IV Proceedings, EDP Sciences, 1996, 06 (C5), pp.C5-153-C5-158. ⟨10.1051/jp4:1996525⟩
Journal de Physique IV Proceedings, EDP Sciences, 1996, 06 (C5), pp.C5-153-C5-158. ⟨10.1051/jp4:1996525⟩
A new experimental method of the determination of the evaporating fields F ev based on Fowler-Nordheim theory is described. This method fits to any materials both refractory and fusible. Especially this method is effective for the thermo-field microp
Publikováno v:
[Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference.
Publikováno v:
XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV..
In the work the results of studying of field evaporation of some metals, alloys and compounds are analyzed for use of these results for creation of the point sources of electrons and ions. The processes of field evaporation at temperatures are higher
Publikováno v:
IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479).
In this paper, field evaporation of edge crystal was studied by means of atom probe at various tip temperatures T: cryogenic, room and the high temperatures T=1300-1600 K. The tips in form of edge crystal were produced insitu by heating of the tips a
Publikováno v:
9th International Vacuum Microelectronics Conference.
Field electron microscope was used for investigation of change of Si deposit on W tip as result of action of some field emission current. Two kinds of deposit have been prepared: 10 monoatomic layers on the W tip deposited at room temperature and the
Publikováno v:
9th International Vacuum Microelectronics Conference.
Field electron emission of Mo on Mo, W on W and Re on Re vacuum deposits has been investigated. Many monatomic layers of Mo, W and Re have been deposited on the tip of the same material. A wide range of substrate temperature has been used: from room
Autor:
O.L. Golubev
Publikováno v:
Journal de Physique IV Proceedings
Journal de Physique IV Proceedings, EDP Sciences, 1996, 06 (C5), pp.C5-159-C5-164. ⟨10.1051/jp4:1996526⟩
Journal de Physique IV Proceedings, EDP Sciences, 1996, 06 (C5), pp.C5-159-C5-164. ⟨10.1051/jp4:1996526⟩
High temperature field evaporation of It and Pt was investigated at the T = 1400 - 1700 K and electric fields F - I V/A by field electron, ion and evaporation microscopy. The Arrenius plot was obtained for the process of field evaporation of Pt in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a56ffa3a090c9cc36dbb128f8b20ecac
https://hal.archives-ouvertes.fr/jpa-00254405/file/ajp-jp4199606C526.pdf
https://hal.archives-ouvertes.fr/jpa-00254405/file/ajp-jp4199606C526.pdf
Akademický článek
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Akademický článek
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