High-tech composites

Autor: S.Y. Zhang, E. Godfrey, W. Kockelmann, A. Paradowska, M. J. Bull, A. M. Korsunsky, B. Abbey, P. Xu, Y. Tomota, D. Liljedahl, O. Zanellato5, M. Fitzpatrick, M. R. Daymond, R. M. Toda, R. A. Holt, J.Kelleher, S. Siano, J. Santisteban

Publikováno v: Materials today (Kidlington) 12 (2009): 78–84. doi:10.1016/S1369-7021(09)70233-0
info:cnr-pdr/source/autori:S.Y. Zhang, E. Godfrey, W. Kockelmann, A. Paradowska, M. J. Bull, A. M. Korsunsky, B. Abbey, P. Xu, Y. Tomota, D. Liljedahl, O. Zanellato5, M. Fitzpatrick, M. R. Daymond, R. M. Toda, R. A. Holt, J.Kelleher, S. Siano, J. Santisteban/titolo:High-tech composites/doi:10.1016%2FS1369-7021(09)70233-0/rivista:Materials today (Kidlington)/anno:2009/pagina_da:78/pagina_a:84/intervallo_pagine:78–84/volume:12

Neutron diffraction methods offer a direct measure of the elastic component of strain deep within crystalline materials through precise characterisation of the interplanar crystal lattice spacing. The unique non-destructive nature of this measurement

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=cnr_________::3dfba91e1c9fdeafbc61813b1b8110ab
https://publications.cnr.it/doc/23047