Zobrazeno 1 - 10
of 20
pro vyhledávání: '"O. V. Savenko"'
Publikováno v:
Russian Microelectronics. 51:454-464
Publikováno v:
Semiconductors. 55:755-763
Publikováno v:
Technical Physics. 65:1912-1921
A theoretical model of the conductivity of a thin metal layer placed in a longitudinal constant magnetic and alternative electric field is constructed, taking into account the diffuse-mirror boundary conditions. An analytical expression is obtained f
Publikováno v:
Semiconductors. 54:1039-1046
The problem of the high-frequency conductivity of a thin conducting layer in a longitudinal magnetic field is solved using a kinetic approach taking into account the mirror-diffusion boundary conditions. The specularity coefficients of the layer surf
Publikováno v:
Physica Scripta. 98:015839
The Expressions for the transverse magnetoresistance coefficient and the Hall coefficient of a film are analytically obtained and analyzed. Quantum dimensional effect is taken into account, but Landau levels are not considered. The film zone structur
Autor:
O V. Savenko
Publikováno v:
Current trends in the development of education system; 147-148
Актуальные вопросы исследования и преподавания родных языков и литератур; 147-148
Актуальные вопросы исследования и преподавания родных языков и литератур; 147-148
В статье рассматривается понятие «фантастика»; объясняется интерес читателя к современной русской и зарубежной фантастике; указываетс
Publikováno v:
Technical Physics. 62:1766-1771
The kinetic problem of finding the rf conductivity and Hall constant of a thin metal film placed in a transverse steady magnetic field and a longitudinal variable electric field has been considered. It has been assumed that electrons diffusely reflec
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 11:1159-1166
The problem of determining the high-frequency electrical conductivity and Hall constant for a thin metal film placed in a transverse stationary magnetic field and in a longitudinal alternating electric field is solved by the kinetic method. The relat
Publikováno v:
Russian Microelectronics. 46:252-260
In this paper, using the kinetic method, we calculate the conductivity of a thin semiconductor layer in an alternating electric field taking into account the different specular reflection coefficients of its surfaces. No constraints are imposed on th
Publikováno v:
Journal of Physics: Conference Series. 1730:012040
A kinetic theory of the conductivity of a thin metal layer in a longitudinal alternative electric field is constructed. We assume the layer thickness is much greater than the electron de Broglie wavelength and less than the skin layer depth. Therefor