Zobrazeno 1 - 10
of 143
pro vyhledávání: '"O. Lohse"'
Autor:
P. Jain, L. Dawahre, F. Laske, H. Steigerwald, S. Ismail, O. Lohse, B. Kalsbeck, P. Y. Portnichenko, F. Oezdogan
Publikováno v:
Photomask Technology 2021.
In this paper we introduce a method of combining the use of the KLA FlashScan® reticle blank defect inspection system and the KLA LMS IPRO reticle pattern registration metrology system for high-precision mask defect inspection and registration. We i
Publikováno v:
Journal of applied physics 92, 2688-2696 (2002).
In this article, the interface screening model is theoretically discussed which explains imprint in ferroelectric thin films caused by a large electric field within a surface layer with deteriorated ferroelectric properties. During aging this field i
Publikováno v:
Journal of Applied Physics. 92:2680-2687
Comprehensive imprint measurements on PbZrxTi1−xO3 (PZT) thin films were carried out. Different models, which were proposed in literature to explain imprint in ferroelectric thin films or a similar aging effect (internal bias) in ferroelectric bulk
Publikováno v:
Journal of applied physics 89, 2332-2336 (2001).
The polarization reversal process of tetragonal Pb(Zr,Ti)O3 thin films has been intensively studied using conventional hysteresis and rectangle pulse measurements. Decreasing the voltage level of the pulses significantly slows down the polarization s
Autor:
S. Tiedke, D. Bolten, U. Boettger, U. Kall, Marcus Kastner, O. Lohse, T. Schmitz, Rainer Waser, M. Grossmann, G. Schindler, Walter Hartner
Publikováno v:
Integrated Ferroelectrics. 32:1-9
The fatigue behavior of PZT thin films was investigated. The fatigue excitation signal was changed with respect to the shape, the amplitude, and the frequency of the signal. It is shown that the fatigue excitation signal has a strong influence on the
Autor:
Rainer Waser, M. Grossmann, U. Boettger, Hermann Kohlstedt, T. Schneller, D. Bolten, O. Lohse, J. Rodrı́guez Contreras
Publikováno v:
Integrated Ferroelectrics. 37:205-214
The imprint behavior of ferroelectric Pb(Zr,Ti)O3 (PZT) films with thin SrRuO3 (SRO) layers at the platinum electrodes was investigated. Different models (defect dipole alignment, bulk screening and interface screening) are discussed which are usuall
Publikováno v:
Integrated Ferroelectrics. 33:39-48
In this work decided measuring techniques and procedures based on conventional hysteresis measurements and fast pulse characterization are exploited to emphasize the meaning of the ferroelectric relaxation for the fast read and write access of the me
Publikováno v:
Integrated Ferroelectrics. 32:93-99
In this paper, the reversible and irreversible polarization contributions in donor doped PbZr0.45Ti0.55O3 are studied. Small signal capacitance measurements under dc-bias are used to measure the reversible contributions. Quasi-static hysteresis measu
Publikováno v:
Integrated Ferroelectrics. 26:331-342
Ba1−xPbxTiO3 (BPT) as a thin film system has been developed to investigate the ferroelectric properties respectively the different ferroelectric polarization contributions. BPT has been synthesized using CSD based on metal propionates. The films we
Publikováno v:
Ferroelectrics. 225:117-123
In this contribution, Ba(1−x)Pbx(Ti, Mn)O3 (BPT) and its properties will be presented. BPT has been synthesized using CSD based on metal propionates. The films were deposited on platinum covered silicon wafers with a spin-on technique. To convert t