Zobrazeno 1 - 3
of 3
pro vyhledávání: '"O. E. Peil"'
Autor:
F. Y. Bruno, M. Gibert, S. McKeown Walker, O. E. Peil, A. de la Torre, S. Riccò, Z. Wang, S. Catalano, A. Tamai, F. Bisti, V. N. Strocov, J.-M. Triscone, F. Baumberger
Publikováno v:
APL Materials, Vol 5, Iss 1, Pp 016101-016101-7 (2017)
Taking advantage of the large electron escape depth of soft x-ray angle resolved photoemission spectroscopy, we report electronic structure measurements of (111)-oriented [LaNiO3/LaMnO3] superlattices and LaNiO3 epitaxial films. For thin films, we ob
Externí odkaz:
https://doaj.org/article/6f18e84c7c6f4fecba282575cfaf7979
Autor:
S. Catalano, M. Gibert, V. Bisogni, O. E. Peil, F. He, R. Sutarto, M. Viret, P. Zubko, R. Scherwitzl, A. Georges, G. A. Sawatzky, T. Schmitt, J.-M. Triscone
Publikováno v:
APL Materials, Vol 2, Iss 11, Pp 116110-116110-7 (2014)
Nickelates are known for their metal to insulator transition (MIT) and an unusual magnetic ordering, occurring at T = TNéel. Here, we investigate thin films of SmNiO3 subjected to different levels of epitaxial strain. We find that the original bulk
Externí odkaz:
https://doaj.org/article/b1589e9587534e78a94ad81e37011376
Publikováno v:
Journal of Physics: Condensed Matter; 11/28/2018, Vol. 30 Issue 47, p1-1, 1p