Zobrazeno 1 - 10
of 28
pro vyhledávání: '"O. Ballan"'
Autor:
Alexander Griessing, Jue Arver, Roland Petersson, O. Ballan, Christina Smith, Pierre Maillard, Federico Venini
Publikováno v:
Microelectronics Reliability. 107:113601
Functional Safety standards for programmable electronic systems require i) the evaluation of the probability of hardware failure occurring to the electronic system due to random faults and ii) a sound estimation of the capability of the system to cor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4cc6e03b4017f147441d3c560afbe0b
https://doi.org/10.1016/j.microrel.2020.113601
https://doi.org/10.1016/j.microrel.2020.113601
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
This paper presents a test methodology using Xilinx System Validation Tool (SVT) design suite to characterize the single event response of Xilinx's 16nm Zynq Ultrascale+ MPSoC dual & quad ARM core processors. Accelerated SEU beam test of a XCZU9EG de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11b963cdc612de7e0cd6f2f9224a29e2
https://doi.org/10.1109/nsrec.2018.8584299
https://doi.org/10.1109/nsrec.2018.8584299
Publikováno v:
Journal of Electronic Testing. 30:317-328
A key issue in many safety-critical applications is the test of the ICs to be performed during the operational phase: regulations and standards often explicitly state the fault coverage figures to be achieved with respect to permanent faults. Functio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70aaac521fc38c3c02b5da115d29653a
https://doi.org/10.1007/s10836-014-5457-5
https://doi.org/10.1007/s10836-014-5457-5
Autor:
Paolo Bernardi, M. Sonza Reorda, Michelangelo Grosso, O. Ballan, L. Ciganda, Eladio F. Sanchez, Riccardo Cantoro, Boyang Du
Publikováno v:
MTV
When the result of a previous instruction is needed in the pipeline before it is available, a "data hazard" occurs. Register Forwarding and Pipeline Interlock (RFaPI) are mechanisms suitable to avoid data corruption and to limit the performance penal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22030bfd3ad63394a101b1c70d402b70
http://hdl.handle.net/11583/2525509
http://hdl.handle.net/11583/2525509
Publikováno v:
IOLTS
A key issue in many safety-critical applications is the test of the ICs to be performed during the operational phase: regulations and standards often explicitly describe fault coverage figures to be achieved. Functional test (i.e., a test exploiting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad69e74e1635b6e3dc1bbe82b9c60df7
https://doi.org/10.1109/iolts.2013.6604049
https://doi.org/10.1109/iolts.2013.6604049
Autor:
L. Ciganda, D. Boyang, O. Ballan, Michelangelo Grosso, Eladio F. Sanchez, Paolo Bernardi, M. Sonza Reorda
Publikováno v:
IDT
When the result of a previous instruction is needed in the pipeline before it is available, a “data hazard” occurs. Register Forwarding and Pipeline Interlock (RFP its test can hardly be achieved with a functional approach, unless a specific test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::350c4374b3338f95d9423fecac4a27e4
http://hdl.handle.net/11583/2505588
http://hdl.handle.net/11583/2505588
Publikováno v:
IOLTS
Nowadays, Software-Based Self-Test (SBST) is growing in importance especially in the on-line test scenario for safety critical systems such as automotive. This paper concentrates on the coverage by SBST of those faults in the scan chain that can impa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f53ef03c407285a8686cdef75245c180
http://hdl.handle.net/11583/2909172
http://hdl.handle.net/11583/2909172
Autor:
M. de Carvalho, Michelangelo Grosso, Ernesto Sanchez, Paolo Bernardi, M. Sonza Reorda, O. Ballan, J. Lagos-Benites, L. Ciganda
Publikováno v:
European Test Symposium
Software-based Self-Test (SBST) can be used during the mission phase of microprocessor-based systems to periodically assess the hardware integrity. However, several constraints are imposed to this approach, due to the coexistence of test programs wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b87d09050a66ff1c14bb4fbbe933e1d3
http://hdl.handle.net/11583/2497505
http://hdl.handle.net/11583/2497505
Publikováno v:
DATE
Scopus-Elsevier
Scopus-Elsevier
Today, electronic devices are increasingly employed in different fields, including safety- and mission-critical applications, where the quality of the product is an essential requirement. In the automotive field, on-line self-test is a dependability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::65cf17d57ece65a268d2cc0e227ee121
http://hdl.handle.net/11583/2380948
http://hdl.handle.net/11583/2380948