Zobrazeno 1 - 10
of 12
pro vyhledávání: '"O L, Krivanek"'
Publikováno v:
Electron Microscopy and Analysis 1997 ISBN: 9781003063056
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::810f19ec7b369aa5996cb739df1e585f
https://doi.org/10.1201/9781003063056-87
https://doi.org/10.1201/9781003063056-87
Publikováno v:
Journal of microscopy. 259(3)
Aberration-corrected scanning transmission electron microscopes are able to form electron beams smaller than 100 pm, which is about half the size of an average atom. Probing materials with such beams leads to atomic-resolution images, electron energy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a1a7dfb52adefb50a84e576aee2f1aa0
https://pubmed.ncbi.nlm.nih.gov/25939916
https://pubmed.ncbi.nlm.nih.gov/25939916
Autor:
D. A. Muller, L. Fitting Kourkoutis, M. Murfitt, J. H. Song, H. Y. Hwang, J. Silcox, N. Dellby, O. L. Krivanek
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7435641d9a35e84bdf9f445a5b58a2d
https://doi.org/10.1007/978-3-540-85156-1_174
https://doi.org/10.1007/978-3-540-85156-1_174
Autor:
J. A. Hunt, O. L. Krivanek
Publikováno v:
Microscopy Today. 5:10-11
Improvements over the past few years in essentially all modern operating systems coupled with the blurring of the boundaries between mainframes, workstations, and personal computers make the choice of platform often one of personal preference other t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::171e7c99dde11cfedf7085a992ce80f1
https://doi.org/10.1017/s1551929500061551
https://doi.org/10.1017/s1551929500061551
Autor:
O. L. Krivanek, P. E. Mooney
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 52:406-407
It is well established that the charge-coupled device (CCD) is the detector of choice in imaging applications requiring sensitivity, dynamic range, linearity and low geometric distortion. It has also been shown that in the electron microscope, indire
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd5f3a6ac87b68055d24698b0a9e258c
https://doi.org/10.1017/s0424820100169766
https://doi.org/10.1017/s0424820100169766
Publikováno v:
Nature. 262:454-457
Careful analysis of high resolution electron micrographs of amorphous materials, making use of a simple optical simulation technique, provides a means for discriminating between ‘meaningful’ and ‘meaningless’ images, and for detecting ordered
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c4ecc76c01020e4f5d62af91da18795
https://doi.org/10.1038/262454a0
https://doi.org/10.1038/262454a0
Autor:
O. L. Krivanek
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 39:216-217
The structure of bulk surfaces can be studied by reflection electron microscopy and the structure of interfaces in thin foils by TEM. Both methods are capable of nearly atomic-level resolution. This paper explores whether the structural information c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::13867c0ea8e7aed07af29f4be448dff6
https://doi.org/10.1017/s042482010009765x
https://doi.org/10.1017/s042482010009765x
Autor:
O. L. Krivanek, A. Higgs
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 39:346-347
Wide angle zone axis patterns (ZAPs) have been acquired by the rock-unrock method by Eades in a Philips 400 and by Tanaka et al. in a JEM 100CX. Tanaka et al. used one set of coils before the specimen for rocking and one after the specimen for unrock
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::109a384e17b19a2e113af26103437a2c
https://doi.org/10.1017/s042482010009823x
https://doi.org/10.1017/s042482010009823x
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 41:118-119
The ability to resolve 2-3Å structurally and 20-50Å chemically has made high resolution electron microscopy (HREM) and microanalysis the preferred techniques for a number of interface studies. The interfaces are usually examined in thin cross-secti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96f46b42d75030c081addfcc633a2fdf
https://doi.org/10.1017/s042482010007446x
https://doi.org/10.1017/s042482010007446x