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pro vyhledávání: '"O Dae Kwon"'
Publikováno v:
Applied Science and Convergence Technology. 25:73-76
Multi-layer films of SiN x /SiO x /InSnO with anti-reflective effect were grown by new-concept plasma enhanced chemical vapor deposition system (PECVD) with hybrid plasma source (HPS). Anti-reflective effect of SiN x /SiO x /InSnO was investigated as
Autor:
O Dae Kwon, Yong-Hyeon Shin, Dae Jin Seong, Kang Woong Lee, Su Jin Yoo, Jung-Hyung Kim, Jae-Hong Jeon, Jong Hyun Seo, Hee Hwan Choe
Publikováno v:
Solid State Phenomena. :327-330
V-I probe measurement is usually used for a method of fault detection of plasma discharges. In this report, a method for monitoring plasma parameter using V-I probe is proposed. Data from the V-I probe were analyzed to estimate the plasma parameters,