Výsledky vyhledávání - "O’Leary, Colum M."

Report

Three-dimensional imaging of buried heterointerfaces

Autor: O'Leary, Colum M., Sha, Haozhi, Zhang, Jianhua, Su, Cong, Kahn, Salman, Jiang, Huaidong, Zettl, Alex, Ciston, Jim, Miao, Jianwei

We report three-dimensional (3D) structure determination of a twisted hexagonal boron nitride (h-BN) heterointerface from a single-view data set using multislice ptychography. We identify the buried heterointerface between two twisted h-BN flakes wit

Externí odkaz: http://arxiv.org/abs/2308.15471

Zobrazit plný text záznamu

Report

Deep Learning Coherent Diffractive Imaging

Autor: Chang, Dillan J., O'Leary, Colum M., Su, Cong, Kahn, Salman, Zettl, Alex, Ciston, Jim, Ercius, Peter, Miao, Jianwei

We report the development of deep learning coherent electron diffractive imaging at sub-angstrom resolution using convolutional neural networks (CNNs) trained with only simulated data. We experimentally demonstrate this method by applying the trained

Externí odkaz: http://arxiv.org/abs/2204.08157

Zobrazit plný text záznamu

Report

Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion

Autor: O'Leary, Colum M., Haas, Benedikt, Koch, Christoph T., Nellist, Peter D., Jones, Lewys

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches. However, at

Externí odkaz: http://arxiv.org/abs/2103.03202

Zobrazit plný text záznamu

Report

Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography

Autor: Martinez, Gerardo T., Shi, Benjamin X., Naginey, Timothy C., Jones, Lewys, O'Leary, Colum M., Pennycook, Timothy J., Nicholls, Rebecca J., Yates, Jonathan R., Nellist, Peter D.

Phase imaging in electron microscopy is sensitive to the local potential, including charge redistribution from bonding. We demonstrate that electron ptychography provides the necessary sensitivity to detect this subtle effect by directly imaging the

Externí odkaz: http://arxiv.org/abs/1907.12974

Zobrazit plný text záznamu