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pro vyhledávání: '"O'Connell, Aaron D."'
Autor:
O'Connell, Aaron D., Ansmann, M., Bialczak, R. C., Hofheinz, M., Katz, N., Lucero, Erik, McKenney, C., Neeley, M., Wang, H., Weig, E. M., Cleland, A. N., Martinis, J. M.
The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured
Externí odkaz:
http://arxiv.org/abs/0802.2404
Autor:
Neeley, Matthew, Ansmann, Markus, Bialczak, Radoslaw C., Hofheinz, Max, Lucero, Erik, O'Connell, Aaron D., Sank, Daniel, Wang, Haohua, Wenner, James, Cleland, Andrew N., Geller, Michael R., Martinis, John M.
Publikováno v:
Science, 2009 Aug 01. 325(5941), 722-725.
Externí odkaz:
https://www.jstor.org/stable/20544262
