Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Nyang'au WO"'
Autor:
Setiono A; Laboratory for Emerging Nanometrology (LENA), Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Research Center for Photonics-National Research and Innovation Agency (BRIN), South Tangerang 15314, Indonesia., Nelfyenny; Research Center for Photonics-National Research and Innovation Agency (BRIN), South Tangerang 15314, Indonesia., Nyang'au WO; Laboratory for Emerging Nanometrology (LENA), Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Department of Metrology, Kenya Bureau of Standards (KEBS), Nairobi 00200, Kenya., Peiner E; Laboratory for Emerging Nanometrology (LENA), Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2024 Apr 05; Vol. 24 (7). Date of Electronic Publication: 2024 Apr 05.
Autor:
Fahrbach M; Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, Hans-Sommer-Straße 66, 38106 Braunschweig, Germany.; Laboratory for Emerging Nanometrology (LENA), Langer Kamp 6a/b, 38106 Braunschweig, Germany., Xu M; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany., Nyang'au WO; Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, Hans-Sommer-Straße 66, 38106 Braunschweig, Germany.; Laboratory for Emerging Nanometrology (LENA), Langer Kamp 6a/b, 38106 Braunschweig, Germany.; Department of Metrology, Kenya Bureau of Standards (KEBS), Popo Rd, Nairobi 00200, Kenya., Domanov O; GETec Microscopy GmbH, Am Heumarkt 13, 1030 Vienna, Austria., Schwalb CH; GETec Microscopy GmbH, Am Heumarkt 13, 1030 Vienna, Austria.; Quantum Design Microscopy GmbH, Im Tiefen See 60a, 64293 Darmstadt, Germany., Li Z; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany., Kuhlmann C; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany., Brand U; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany., Peiner E; Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig, Hans-Sommer-Straße 66, 38106 Braunschweig, Germany.; Laboratory for Emerging Nanometrology (LENA), Langer Kamp 6a/b, 38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Feb 10; Vol. 23 (4). Date of Electronic Publication: 2023 Feb 10.
Autor:
Nyang'au WO; Institute of Semiconductor Technology (IHT) and Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, D38106 Braunschweig, Germany.; Department of Metrology, Kenya Bureau of Standards (KEBS), 00200 Nairobi, Kenya., Setiono A; Institute of Semiconductor Technology (IHT) and Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, D38106 Braunschweig, Germany.; Research Center for Physics, Indonesian Institute of Sciences (LIPI), Kawasan Puspiptek Serpong, Tangerang Selatan 15314, Indonesia., Schmidt A; Institute of Semiconductor Technology (IHT) and Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, D38106 Braunschweig, Germany., Bosse H; Precision Engineering Division, Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany., Peiner E; Institute of Semiconductor Technology (IHT) and Laboratory for Emerging Nanometrology (LENA), Technische Universität Braunschweig, D38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2020 Apr 28; Vol. 20 (9). Date of Electronic Publication: 2020 Apr 28.
Autor:
Setiono A; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Research Center for Physics, Indonesian Institute of Sciences (LIPI), 15314 Tangerang Selatan, Indonesia., Bertke M; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Nyang'au WO; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Department of Metrology, Kenya Bureau of Standards (KEBS), 00200 Nairobi, Kenya., Xu J; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Fahrbach M; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Kirsch I; Fraunhofer Wilhelm-Klauditz-Institut (WKI), 38108 Braunschweig, Germany., Uhde E; Fraunhofer Wilhelm-Klauditz-Institut (WKI), 38108 Braunschweig, Germany., Deutschinger A; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Fantner EJ; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Schwalb CH; GETec Microscopy GmbH, 1220 Vienna, Austria., Wasisto HS; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Peiner E; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2020 Jan 22; Vol. 20 (3). Date of Electronic Publication: 2020 Jan 22.
Autor:
Nyang'au WO; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany. wilombat@tu-braunschweig.de.; Department of Metrology, Kenya Bureau of Standards (KEBS), Nairobi 00200, Kenya. wilombat@tu-braunschweig.de., Setiono A; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany. a.setiono@tu-braunschweig.de.; Research Center for Physics, Indonesian Institute of Sciences (LIPI), Kawasan Puspiptek Serpong, Tangerang Selatan 15314, Indonesia. a.setiono@tu-braunschweig.de., Bertke M; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany. m.bertke@tu-braunschweig.de., Bosse H; Precision Engineering Division, Physikalisch-Technische Bundesanstalt (PTB), 38116 Braunschweig, Germany. Harald.Bosse@ptb.de., Peiner E; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany. e.peiner@tu-braunschweig.de.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2019 Nov 01; Vol. 19 (21). Date of Electronic Publication: 2019 Nov 01.