Zobrazeno 1 - 2
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pro vyhledávání: '"Nupur Bajad"'
Publikováno v:
2020 Pan Pacific Microelectronics Symposium (Pan Pacific).
A design of experiment (DOE) analysis is reported on data from warpage simulations using finite element analysis (FEA) of a lidded electronics package. Warpage in a lid of an optical electronics package can detrimentally affect the reliability of the
Publikováno v:
Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).