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pro vyhledávání: '"Norman N. Roth"'
Autor:
James P. Hofmeister, Pradeep Lall, Dhananjay Panchagade, Norman N. Roth, Terry A. Tracy, Justin B. Judkins, Kenneth L. Harris
Publikováno v:
2008 IEEE Aerospace Conference.
This paper presents test results and specifications for SJ BISTTM, an innovative sensing method for detecting faults in solder-joint networks that belong to the I/O ports of field programmable gate arrays (FPGAs), especially in ball grid array packag
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8775b0fa4e8247dbd44a749ee05f0b0
https://doi.org/10.1109/aero.2008.4526624
https://doi.org/10.1109/aero.2008.4526624
Publikováno v:
IEEE Aerospace & Electronic Systems; Jun2008, Vol. 23 Issue 6, p31-38, 8p