Zobrazeno 1 - 10
of 129
pro vyhledávání: '"Norman A. Sanford"'
Publikováno v:
Microscopy and Microanalysis. 27:412-415
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::570f32cbefd95cc2e099a08c6bae4416
https://doi.org/10.1017/s1431927621001999
https://doi.org/10.1017/s1431927621001999
Autor:
Paul T. Blanchard, Luis Miaja-Avila, Norman A. Sanford, Brian P. Gorman, Ann N. Chiaramonti, David R. Diercks
Publikováno v:
Microsc Microanal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fadb2d1a5e46d38d4ad4f09fd01c8b99
https://pubmed.ncbi.nlm.nih.gov/35979403
https://pubmed.ncbi.nlm.nih.gov/35979403
Publikováno v:
Journal of Electronic Materials. 50:3022-3029
Rigorous electrostatic modeling of the specimen electrode environment is required to better understand the fundamental processes of atom probe tomography (APT) and guide the analysis of APT data. We have developed a simulation tool that self-consiste
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2b5f2be03f606e52c4772010ec2c05b
https://doi.org/10.1007/s11664-021-08932-6
https://doi.org/10.1007/s11664-021-08932-6
Autor:
Matthew D. Brubaker, David R. Diercks, Norman A. Sanford, Brian P. Gorman, Kris A. Bertness, Ashwin K. Rishinaramangalam, Albert V. Davydov, Benjamin W. Caplins, Ann N. Chiaramonti, Luis Miaja-Avila, Daniel F. Feezell, Paul T. Blanchard
Publikováno v:
The Journal of Physical Chemistry C. 125:2626-2635
Laser-pulsed atom probe tomography (LAPT) is a materials characterization technique that has been widely applied in the study and characterization of III-nitride semiconductors. To date, most of th...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b765e137ba6a7adbe99b85b30e483af8
https://doi.org/10.1021/acs.jpcc.0c08753
https://doi.org/10.1021/acs.jpcc.0c08753
Autor:
Kevin J. Coakley, Norman A. Sanford
Publikováno v:
Ultramicroscopy
In laser-assisted atom probe tomography, an important goal is to reconstruct the mass-to-charge ratio, (m/z), spectrum due to various ion species. In general, the probability mass function (pmf) associated with the time-of-flight (TOF) spectrum produ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01dd293e759064c437f24836bac8e938
https://pubmed.ncbi.nlm.nih.gov/35452870
https://pubmed.ncbi.nlm.nih.gov/35452870
Autor:
David R. Diercks, Benjamin W. Caplins, Norman A. Sanford, Ann N. Chiaramonti, Luis Miaja-Avila, Paul T. Blanchard
Publikováno v:
Ultramicroscopy
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b830ba85d06a3e15d4f57558d2c9e37d
https://europepmc.org/articles/PMC7536741/
https://europepmc.org/articles/PMC7536741/
Autor:
Norman A. Sanford, Benjamin W. Caplins, David R. Diercks, Brian P. Gorman, Paul T. Blanchard, Ann N. Chiaramonti, Luis Miaja-Avila
Publikováno v:
Microsc Microanal
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic gener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dfa5953e33b2be249a03c7db6c330b95
https://europepmc.org/articles/PMC7195254/
https://europepmc.org/articles/PMC7195254/
Autor:
Luis Miaja-Avila, Norman A. Sanford, Ann N. Chiaramonti, Benjamin W. Caplins, Brian P. Gorman, David R. Diercks
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger field ion emission at the tip's apex. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35300d9ec0fd843f021cd91067b950f4
https://doi.org/10.1117/12.2551898
https://doi.org/10.1117/12.2551898
Autor:
Paul T. Blanchard, David R. Diercks, Luis Miaja-Avila, Ann N. Chiaramonti, Norman A. Sanford, Benjamin W. Caplins
Publikováno v:
Microscopy and Microanalysis. 26:2880-2881
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c938a4a0138433427981b08c9aa62f9
https://doi.org/10.1017/s1431927620023089
https://doi.org/10.1017/s1431927620023089