Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Norihiro Ikeno"'
Publikováno v:
Surface and Interface Analysis. 50:1191-1194
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed4e130d227befe67ce0e3d3c1db5d30
https://doi.org/10.1002/sia.6420
https://doi.org/10.1002/sia.6420
Autor:
Keisuke Kobayashi, Hideki Yoshikawa, Yoshiyuki Yamashita, Norihiro Ikeno, Takahiro Nagata, Seungjun Oh, Toyohiro Chikyow, Yutaka Wakayama
Publikováno v:
Thin Solid Films. 554:194-198
We used hard X-ray photoelectron spectroscopy (HX-PES) to investigate the polarity effect of ZnO, which has Zn terminated (+ polar) and O terminated (− polar) surfaces, on poly(3-hexylthiophene-2,5-diyl) (P3HT)/ZnO photovoltaic structures. HX-PES,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2350391bbe53ee917f2f97ec1547cd37
https://doi.org/10.1016/j.tsf.2013.08.018
https://doi.org/10.1016/j.tsf.2013.08.018
Autor:
Haruhiko Yoshida, Norihiro Ikeno, T. Katsumata, Koji Arafune, Shinichi Satoh, A. Ogura, T. Chikyow
Publikováno v:
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccdbca02174f3c16502076f1f95167bd
https://doi.org/10.7567/ssdm.2015.c-7-4
https://doi.org/10.7567/ssdm.2015.c-7-4
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
We investigated the crystalline damage induced by SiN passivation film deposited by conventional plasma enhanced chemical vapor deposition using Raman spectroscopy. From Raman peak shift and width, we evaluated the crystalline damage in the Si surfac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::633ad56e0c431d55a7242aea050e7d14
https://doi.org/10.1109/pvsc.2015.7356320
https://doi.org/10.1109/pvsc.2015.7356320
Autor:
Haruhiko Yoshida, Koji Arafune, Yoshihiro Yamashita, Takaaki Katsumata, Toyohiro Chikyow, Atsushi Ogura, Shinichi Satoh, Norihiro Ikeno
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
We fabricated Y2O3-ZrO2 composition film (YZO) on Al2O3 for the field effect passivation with high negative fixed charge densities on p-type Si. The surface recombination velocity was improved down to 30 cm/s after annealing at 400 °C. High thermal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15b186aaf8d712c7c6fa1c912e48ed10
https://doi.org/10.1109/pvsc.2015.7356330
https://doi.org/10.1109/pvsc.2015.7356330
Autor:
Haruhiko Yoshida, Norihiro Ikeno, K. Arafune, Atsushi Ogura, Toyohiro Chikyow, Shinichi Satoh, T. Katsumata
Publikováno v:
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC).
We investigated stacking double layer structure, the Y 2 O 3 -ZrO 2 composite film (YZO) on AlO x , for the field effect passivation with high negative fixed charge densities on p-type Si. The composition spread YZO films were deposited at room tempe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0a8c5e4600f562d9f58cd11efca1352
https://doi.org/10.1109/pvsc.2014.6924993
https://doi.org/10.1109/pvsc.2014.6924993
Autor:
Takahiro Nagata, Shinichi Satoh, Hyunju Lee, Toyohiro Chikyow, Norihiro Ikeno, Haruhiko Yoshida, Atsushi Ogura, K. Arafune
Publikováno v:
Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a29f652e64fa22f22a451ea897032f9
https://doi.org/10.7567/ssdm.2013.ps-15-2
https://doi.org/10.7567/ssdm.2013.ps-15-2
Autor:
Haruhiko Yoshida, Atsushi Ogura, Koji Arafune, Taka Aki Katsumata, Norihiro Ikeno, Toyohiro Chikyow, Shin Ichi Satoh
Publikováno v:
Japanese Journal of Applied Physics. 55:04ES03
We fabricated a Y2O3–ZrO2 film (YZO) on Al2O3 to achieve the field effect passivation with high negative fixed charge densities on p-type Si. The surface recombination velocity was improved down to 30 cm/s after annealing at 400 °C. This improveme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a251dc4cdcd6f673eee59d4ad5be558c
https://doi.org/10.7567/jjap.55.04es03
https://doi.org/10.7567/jjap.55.04es03
Autor:
Toyohiro Chikyow, K. Matsumoto, A. Ogura, Haruhiko Yoshida, Kenichirou Takahashi, K. Arafune, T. Tachibana, Shinichi Satoh, Norihiro Ikeno, Hyunju Lee, Naomi Sawamoto
Publikováno v:
Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::153f7825f030675a4a30bced18aa6bf7
https://doi.org/10.7567/ssdm.2011.p-14-1
https://doi.org/10.7567/ssdm.2011.p-14-1
Autor:
Norihiro Ikeno, Hyunju Lee, K. Arafune, J. Hamano, Tomihisa Tachibana, Toyohiro Chikyow, Shinichi Satoh, Atsushi Ogura, R. Matsutani, J. Fujieda, Haruhiko Yoshida
Publikováno v:
2011 International Meeting for Future of Electron Devices.
A scanning capacitance microscopy (SCM) has been applied to the electrical characterization of passivation films for crystalline Si solar cells. An Y 2 O 3 -Al 2 O 3 system, which is a binary composition spread oxide film, was used as a fixed-charge-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a7fbc3839dff12146a17410efa673cc
https://doi.org/10.1109/imfedk.2011.5944851
https://doi.org/10.1109/imfedk.2011.5944851