Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Norhanani Binte Jaafar"'
Publikováno v:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
Publikováno v:
2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC).
Autor:
Weiguo Chen, Yuan Hsing Fu, Doris K. T. Ng, Yuan Gao, Lennon Yao Ting Lee, Norhanani Binte Jaafar, Tan-Tan Zhang, Eldwin J. Ng, Hong Cai, Linfang Xu, Li-Yan Siow, Chong-Pei Ha, Qingxin Zhang
Publikováno v:
2021 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers).
CO 2 gas sensing responses are measured using our in-house fabricated CMOS-MEMS ScAlN-based pyroelectric detector with 12% Sc doped concentration. Leveraging on mid-IR absorption behavior of CO 2 gas caused by interaction of CO 2 with light at 4.26
Autor:
Norhanani Binte Jaafar, Tai Chong Chai, Ser Choong Chong, Sharon Pei Siang Lim, Sharon Seow Huang Lim
Publikováno v:
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC).
The Fan-out wafer-level packaging technology is an integrated circuit technology as well as an enhancement of standard wafer-level packaging (WLP) solutions. This technology is an attractive packaging approach for mobile applications and heterogeneou
Publikováno v:
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC).
Current industry trends in the microelectronics packaging is going towards increasing in I/O density and small size packaging. Common use of solder material in packaging are the lead free solders. The popular lead free alloys include the SnAgCu (SAC)
Autor:
Li Yan Siow, Qingxin Zhang, Yuan Gao, Lennon Yao Ting Lee, Hong Cai, Linfang Xu, Eldwin J. Ng, Yuan Hsing Fu, Norhanani Binte Jaafar, Doris K. T. Ng, Chong Pei Ho, Tan-Tan Zhang, Weiguo Chen
Publikováno v:
Sensors and Actuators B: Chemical. 346:130437
We demonstrate NDIR CO2 gas sensing using CMOS compatible MEMS ScAlN-based pyroelectric detectors. The ScAlN-based pyroelectric detectors are fabricated using 8-inch wafer level technology with 12 % Sc-doped AlN deposited at a temperature of ∼200
Publikováno v:
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC).
In the recent years, the industry is moving towards finer, higher density interconnections and better electrical performance from the die to the substrate. The 3D stack assembly using through silicon via (TSVs) has been emerging as a good solution by
Publikováno v:
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC).
SnAgCu305 (SAC305) solder alloy is extensively used as solder bump interconnects in industry due to their high strength and good reliability performance. SAC305 solder bump is applicable both to 1st and 2nd level solder interconnects. It connects the
Publikováno v:
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC).
Laser solder ball jetting is tremendously flexibility along with its advantages of no mechanical stress and low thermal on the processes packages during the assembly process. In comparison to reflow soldering using conventional method, laser reflow i
Publikováno v:
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC).
Wire bonding is still popular and leading interconnect technologies due to its reliability, reputation for versatility and performance. Increased demand for disposal medical sensors, miniaturization for portable electronic equipment and specialty par