Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Noohul Basheer Zain Ali"'
Publikováno v:
Sensors, Vol 17, Iss 8, p 1719 (2017)
With the advancement of digital microfluidics technology, applications such as on-chip DNA analysis, point of care diagnosis and automated drug discovery are common nowadays. The use of Digital Microfluidics Biochips (DMFBs) in disease assessment and
Externí odkaz:
https://doaj.org/article/ca9fddf13f2a4492b9542688bde62b7d
Publikováno v:
IEEE Sensors Journal. 17:6279-6294
The presence of cracks on the surface of MEMS microelectromechanical system (MEMS) devices affects their functional parameter, such as resonance frequency. Overtime, these cracks may cause the devices’ failure. Therefore, it is important to identif
Autor:
Krishnendu Chakrabarty, Noohul Basheer Zain Ali, Vineeta Shukla, Nor Hisham Hamid, Fawnizu Azmadi Hussin
Publikováno v:
Journal of Electronic Testing. 33:621-635
Digital microfluidics is an emerging class of lab-on-a-chip system. Reliability is a critical performance parameter as these biochips are employed in various safety-critical biomedical applications. With the introduction of highly scalable, reconfigu
Autor:
Noohul Basheer Zain Ali, Nor Hisham Hamid, Aamir F. Malik, Muhammad Shoaib, Mohammad Tariq Jan
Publikováno v:
Journal of Sensors, Vol 2016 (2016)
The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices ar
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23:580-583
Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage $(V_{\r
Publikováno v:
2016 6th International Conference on Intelligent and Advanced Systems (ICIAS).
This paper presents edge crack fault modeling for piezoelectric cantilever based MEMS sensor using LTI (linear time invariant) technique. Frequency fault model is developed to analyze the dynamic behavior of the device in term of displacement, freque
Publikováno v:
2016 6th International Conference on Intelligent and Advanced Systems (ICIAS).
Digital microfluidics biochips has led to the revolution of modern day clinical diagnostics procedures. These biochips enable the use of nano-liter volume of samples and reagents. A more recent architecture of digital microfluidics known as Micro-ele
Autor:
Madiha Arshad Sheikh, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Vineeta Shukla, Noohul Basheer Zain Ali
Publikováno v:
VLSI Design
The research in the area of digital micro fluidics biochips testing is rapidly growing. The recently proposed Micro-electrode Dot Array (MEDA) based digital micro fluidics architecture allows dynamic grouping of the micro-electrodes to form the desir
Autor:
Noohul Basheer Zain Ali, Nor Hisham Hamid, Fawnizu Azmadi Hussin, Madiha Arshad Sheikh, Vineeta Shukla
Publikováno v:
2015 6th Asia Symposium on Quality Electronic Design (ASQED).
Reliability of digital microfluidic biochips (DMFB) emerges to be a critical issue, as they are becoming a popular alternative for laboratory experiments like DNA analysis, immunoassays and safety critical clinical diagnostics. To improve DMFB reliab
Autor:
Fawnizu Azmadi Hussin, Raja Mahmud Adnan, Ghazanfar Ali, Noohul Basheer Zain Ali, Nor Hisham Hamid
Publikováno v:
2014 IEEE Dallas Circuits and Systems Conference (DCAS).
IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 sta