Zobrazeno 1 - 10
of 44
pro vyhledávání: '"Nonlinear analog circuits"'
Publikováno v:
Journal of Electronic Testing. 36:485-498
Considering the problem to diagnose incipient faults in nonlinear analog circuits, a novel approach of fault feature-extracting based on HMFT (high order moment fractional transform) of the component parameter change is proposed. Firstly, the equival
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff52d1b88f919c64d9e4232bd3b80444
https://doi.org/10.1007/s10836-020-05889-y
https://doi.org/10.1007/s10836-020-05889-y
Publikováno v:
Tehnički vjesnik
Volume 28
Issue 6
Tehnički Vjesnik, Vol 28, Iss 6, Pp 2121-2126 (2021)
Volume 28
Issue 6
Tehnički Vjesnik, Vol 28, Iss 6, Pp 2121-2126 (2021)
To obtain feature information of soft faults in non-linear analog circuits in a more effective way, this paper proposed a novel feature extraction method for soft faults in non-linear analog circuits based on Local Mean Decomposition-Generalized Frac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c510bada932ae8d519013081c75d7155
https://hrcak.srce.hr/file/385034
https://hrcak.srce.hr/file/385034
Automated Model Generation Including Variations for Formal Verification of Nonlinear Analog Circuits
Autor:
Yeremia Gunawan Adhisantoso, Malgorzata Rechmal-Lesse, Gerald Alexander Koroa, Markus Olbrich
Publikováno v:
NEWCAS
With the advancements in analog/mixed-signal (AMS) systems and continuously shrinking design sizes, there is an increased demand for reliable verification to ensure correct behavior. To overcome this obstacle, using formal verification is a promising
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21e416105a5d0d616408430d5cdcf64a
https://doi.org/10.1109/newcas49341.2020.9159822
https://doi.org/10.1109/newcas49341.2020.9159822
Publikováno v:
Modelling, Measurement and Control A. 90:58-73
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::189e83c05165a7ef21c87c1ff1b3217e
https://doi.org/10.18280/mmc_a.900105
https://doi.org/10.18280/mmc_a.900105
Autor:
Markus Olbrich, Malgorzata Rechmal-Lesse, Gerald Alexander Koroa, Yeremia Gunawan Adhisantoso
Publikováno v:
Microelectronics Reliability. 121:114119
This paper tackles the analog and mixed-signal modeling for verification challenges. It proposes an adjustable automated modeling approach, which provides set-valued models with reduced overapproximation. The models reliably enclose parameter variati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bfd686d3170e4e128f4b641067d3fd8
https://doi.org/10.1016/j.microrel.2021.114119
https://doi.org/10.1016/j.microrel.2021.114119
Conference
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Publikováno v:
Circuits, Systems, and Signal Processing. 32:2151-2170
Aiming at the problem to diagnose incipient faults in weak nonlinear analog circuits, an approach is presented in this paper. The approach calculates the fractional Volterra correlation functions beforehand. The next step is to use the fractional Vol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64408dd70f623643302a67dcbef11e25
https://doi.org/10.1007/s00034-013-9589-0
https://doi.org/10.1007/s00034-013-9589-0
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 61:358-367
Aiming at the problem to locate parametric faults in nonlinear analog circuits, a new approach based on the subband decomposition combined with coherence functions is proposed. First, the Volterra series of the circuit under test decomposed by wavele
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e5fac58dddb4e5da39093e8cd7f5ce1
https://doi.org/10.1109/tim.2011.2161930
https://doi.org/10.1109/tim.2011.2161930
Publikováno v:
Procedia Engineering. 29:4152-4156
Fault modeling is the key and the difficulty of analog and mixed-signal circuits. The existing fault model include resistance model, perfect switch model, MOS transistor width-length ratio model and slope fault model, these methods have succeed in a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa8ffa5d1d6935ad9a671c6a1852fef5
Publikováno v:
Metrology and Measurement Systems. 19:203-218
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Considering the problem to diagnose incipient faults in nonlinear analog circuits, a novel approach based on fractional correlation is proposed and the application of the subband Volterra ser
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63b7337cfba6457bb2f6848adabdee00
https://doi.org/10.2478/v10178-012-0018-7
https://doi.org/10.2478/v10178-012-0018-7