Zobrazeno 1 - 10
of 187
pro vyhledávání: '"Nolhier, N."'
Publikováno v:
In Microelectronics Reliability September 2017 76-77:685-691
Publikováno v:
In Microelectronics Reliability September 2016 64:88-92
Publikováno v:
In Microelectronics Reliability November 2015 55(11):2276-2283
Publikováno v:
In Microelectronics Reliability September-October 2014 54(9-10):2272-2277
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1278-1283
Publikováno v:
In Microelectronics Reliability February 2013 53(2):221-228
Autor:
Ruan, J., Nolhier, N., Papaioannou, G.J., Trémouilles, D., Puyal, V., Villeneuve, C., Idda, T., Coccetti, F., Plana, R.
Publikováno v:
In Microelectronics Reliability 2009 49(9):1256-1259
Publikováno v:
In Solid State Electronics 2008 52(5):663-674
Publikováno v:
In Microelectronics Reliability 2008 48(8):1237-1240
Publikováno v:
In Microelectronics Reliability 2007 47(9):1818-1822