Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Noe GT"'
Autor:
Yahiaoui R; Department of Electrical and Computer Engineering, University of Illinois Chicago, Chicago, Illinois 60607, United States., Chase ZA; Department of Electrical and Computer Engineering, University of Illinois Chicago, Chicago, Illinois 60607, United States., Kyaw C; Department of Electrical and Computer Engineering, University of Illinois Chicago, Chicago, Illinois 60607, United States., Tay F; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 70005, United States.; Applied Physics Graduate Program, Smalley-Curl Institute, Rice University, Houston, Texas 77005, United States., Baydin A; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 70005, United States.; Smalley-Curl Institute, Rice University, Houston, Texas 77005, United States., Noe GT; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 70005, United States., Song J; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Kono J; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 70005, United States.; Smalley-Curl Institute, Rice University, Houston, Texas 77005, United States.; Department of Physics and Astronomy, Rice University, Houston, Texas 77005, United States.; Department of Materials Science and NanoEngineering, Rice University, Houston, Texas 77005, United States., Agrawal A; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.; Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, United States., Bamba M; The Hakubi Center for Advanced Research, Kyoto University, Kyoto 606-8501, Japan.; Department of Physics I, Kyoto University, Kyoto 606-8502, Japan., Searles TA; Department of Electrical and Computer Engineering, University of Illinois Chicago, Chicago, Illinois 60607, United States.
Publikováno v:
Nano letters [Nano Lett] 2022 Dec 28; Vol. 22 (24), pp. 9788-9794. Date of Electronic Publication: 2022 Dec 05.
Autor:
Baydin A; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA.; Smalley-Curl Institute, Rice University, Houston, Texas, 77005, USA., Hernandez FGG; Instituto de Física, Universidade de São Paulo, São Paulo, São Paulo 05508-090, Brazil., Rodriguez-Vega M; Theoretical Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA., Okazaki AK; Laboratório Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais, São José dos Campos, São Paulo 12201-970, Brazil., Tay F; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA.; Applied Physics Graduate Program, Smalley-Curl Institute, Rice University, Houston, Texas 77005, USA., Noe GT; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Katayama I; Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan., Takeda J; Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan., Nojiri H; Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan., Rappl PHO; Laboratório Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais, São José dos Campos, São Paulo 12201-970, Brazil., Abramof E; Laboratório Associado de Sensores e Materiais, Instituto Nacional de Pesquisas Espaciais, São José dos Campos, São Paulo 12201-970, Brazil., Fiete GA; Department of Physics, Northeastern University, Boston, Massachusetts 02115, USA.; Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Kono J; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA.; Smalley-Curl Institute, Rice University, Houston, Texas, 77005, USA.; Department of Physics and Astronomy, Rice University, Houston, Texas 77005, USA.; Department of Material Science and NanoEngineering, Rice University, Houston, Texas 77005, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2022 Feb 18; Vol. 128 (7), pp. 075901.
Autor:
Li X; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Yoshioka K; Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan., Zhang Q; School of Physics, Nanjing University, Nanjing 210093, China., Peraca NM; Department of Physics and Astronomy, Rice University, Houston, Texas 77005, USA., Katsutani F; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Gao W; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Noe GT; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Watson JD; Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, USA., Manfra MJ; Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, USA., Katayama I; Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan., Takeda J; Department of Physics, Graduate School of Engineering Science, Yokohama National University, Yokohama 240-8501, Japan., Kono J; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA.; Department of Physics and Astronomy, Rice University, Houston, Texas 77005, USA.; Department of Material Science and NanoEngineering, Rice University, Houston, Texas 77005, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2020 Oct 16; Vol. 125 (16), pp. 167401.
Autor:
Blancon JC; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA. jblancon@lanl.gov., Stier AV; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA., Tsai H; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.; Department of Materials Science and Nanoengineering, Rice University, Houston, TX, 77005, USA., Nie W; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA., Stoumpos CC; Department of Chemistry, Northwestern University, Evanston, IL, 60208, USA., Traoré B; Univ Rennes, ENSCR, INSA Rennes, CNRS, ISCR (Institut des Sciences Chimiques de Rennes)-UMR 6226, F-35000, Rennes, France., Pedesseau L; Univ Rennes, INSA Rennes, CNRS, Institut FOTON-UMR 6082, F-35000, Rennes, France., Kepenekian M; Univ Rennes, ENSCR, INSA Rennes, CNRS, ISCR (Institut des Sciences Chimiques de Rennes)-UMR 6226, F-35000, Rennes, France., Katsutani F; Department of Electrical and Computer Engineering, Rice University, Houston, TX, 77005, USA., Noe GT; Department of Electrical and Computer Engineering, Rice University, Houston, TX, 77005, USA., Kono J; Department of Materials Science and Nanoengineering, Rice University, Houston, TX, 77005, USA.; Department of Electrical and Computer Engineering, Rice University, Houston, TX, 77005, USA.; Department of Physics and Astronomy, Rice University, Houston, TX, 77005, USA., Tretiak S; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA., Crooker SA; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA., Katan C; Univ Rennes, ENSCR, INSA Rennes, CNRS, ISCR (Institut des Sciences Chimiques de Rennes)-UMR 6226, F-35000, Rennes, France., Kanatzidis MG; Department of Chemistry, Northwestern University, Evanston, IL, 60208, USA.; Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208, USA., Crochet JJ; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA., Even J; Univ Rennes, INSA Rennes, CNRS, Institut FOTON-UMR 6082, F-35000, Rennes, France. jacky.even@insa-rennes.fr., Mohite AD; Los Alamos National Laboratory, Los Alamos, NM, 87545, USA. adm4@rice.edu.; Department of Chemical and Biomolecular Engineering, Rice University, Houston, TX, 77005, USA. adm4@rice.edu.
Publikováno v:
Nature communications [Nat Commun] 2018 Jun 08; Vol. 9 (1), pp. 2254. Date of Electronic Publication: 2018 Jun 08.
Autor:
Noe GT, Katayama I, Katsutani F, Allred JJ, Horowitz JA, Sullivan DM, Zhang Q, Sekiguchi F, Woods GL, Hoffmann MC, Nojiri H, Takeda J, Kono J
Publikováno v:
Optics express [Opt Express] 2016 Dec 26; Vol. 24 (26), pp. 30328-30337.
Publikováno v:
Applied optics [Appl Opt] 2014 Sep 10; Vol. 53 (26), pp. 5850-5.
Autor:
Noe GT 2nd; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Nojiri H; Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan., Lee J; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Woods GL; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA., Léotin J; Laboratoire National des Champs Magnétiques Intenses, CNRS-UJF-UPS-INSA, Toulouse, France., Kono J; Department of Electrical and Computer Engineering, Rice University, Houston, Texas 77005, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2013 Dec; Vol. 84 (12), pp. 123906.
Autor:
Kim JH; Departments of Electrical & Computer Engineering and Physics & Astronomy, Rice University, Houston, TX 77005, USA., Noe GT 2nd, McGill SA, Wang Y, Wójcik AK, Belyanin AA, Kono J
Publikováno v:
Scientific reports [Sci Rep] 2013 Nov 21; Vol. 3, pp. 3283. Date of Electronic Publication: 2013 Nov 21.