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pro vyhledávání: '"Nobuyuki Nakagiri"'
Autor:
Nobuyuki Nakagiri
Publikováno v:
Compendium of Surface and Interface Analysis ISBN: 9789811061554
As shown in Fig. 88.1, a very small MOS (metal–oxide–silicon) structure is formed by contacting the metallic tip of the AFM (Atomic Force Microscopy) to the oxide surface of the silicon sample.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ab9cd4e3c931639d06f7f7fe84e3da30
https://doi.org/10.1007/978-981-10-6156-1_88
https://doi.org/10.1007/978-981-10-6156-1_88
Publikováno v:
Surface and Coatings Technology. :211-214
An investigation is carried out to evaluate the resolution of a vacuum ultraviolet (VUV)-exposure system for micropatterning organosilane self-assembled monolayers (SAMs) using Kelvin-probe force microscopy (KFM). An organosilane (CH3(CH2)17Si(OCH3)3
Publikováno v:
Applied Surface Science. 188:403-410
Surface potentials of organosilane self-assembled monolayers (SAMs) formed on silicon substrates were measured using Kelvin-probe force microscopy (KFM) employing a SAM formed from n -octadecyltrimethoxysilane [ODS: CH 3 (CH 2 ) 17 Si(OCH 3 ) 3 ] as
Publikováno v:
Langmuir. 16:7796-7800
The effect of local curvature of a sample surface on capillary and interface tension adhesion forces of the water meniscus formed between the AFM tip and sample in air is demonstrated both theoretically and experimentally. We propose an analytical so
Publikováno v:
Langmuir. 15:5093-5097
We applied force curve mapping to chromosomes. Two types of artifacts were observed in the adhesion force images thus obtained. Location shifting between the adhesion and topographic images and deformation of the measured adhesive structure were seen
Autor:
Katsumi Sugisaki, Nobuyuki Nakagiri
Publikováno v:
Applied Surface Science. :613-617
Force curve mapping is expected to become a useful technique for material analysis. In order to analyze the huge amount of force curve data involved in such mapping, we have developed specialized data processing software. This software can extract th
Characterization of individual diamond crystals in micro diamond arrays using an AFM-based technique
Autor:
Hiroyuki Sugimura, Matsufumi Takaya, Osamu Takai, Nobuyuki Nakagiri, Kazuya Ushiyama, Yoshiki Sato, Yukihiro Sakamoto
Publikováno v:
Applied Surface Science. :593-597
Micro diamond arrays (MDA), in which thousands of diamond micro particles are aligned in μm scale accuracy, were fabricated by site-selective plasma chemical vapor deposition (PCVD). This method is based on the higher nucleation density of diamond o
Publikováno v:
Thin Solid Films. 334:161-164
By means of microwave plasma chemical vapor deposition (CVD), diamond was synthesized onto platinum (Pt), silicon (Si) and silicon dioxide (SiO2) surfaces. The nucleation density of diamond on the Pt surface was much higher than on the other surfaces
Autor:
Hiroyuki Sugimura, Nobuyuki Nakagiri
Publikováno v:
Nanotechnology. 8:A15-A18
An organosilane monolayer consisting of trimethylsilyl ([ - ) groups prepared on the native oxide of a silicon substrate effectively served as a resist material for AFM-based nanolithography. The patterning of this resist was performed through its el
Autor:
Yoshihiko Suzuki, Hiroyuki Sugimura, Nobuyuki Nakagiri, Yamamoto Takuma, Shunji Watanabe, Masayuki Miyashita
Publikováno v:
Nanotechnology. 8:A32-A37
In this paper we describe the application of scanning capacitance microscopy (SCM) to two different types of samples: a Si semiconductor sample with three different dopant regions and a ferroelectric thin film deposited on a metal substrate. In our s