Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Nobutomo Uehara"'
Publikováno v:
2022 IEEE Frontiers in Education Conference (FIE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d635bc4bd7a5fd7f12d6a65ef04ab54
https://doi.org/10.1109/fie56618.2022.9962656
https://doi.org/10.1109/fie56618.2022.9962656
Autor:
Takeshi Fujihara, Korakot Onlaor, Masaru Kamano, Tomoya Konishi, Benchapol Tunhoo, Nobutomo Uehara, Natpasit Chaithanatkun, Takanori Kozai
Publikováno v:
Materials Today: Proceedings. 4:6079-6084
In this study, zinc oxide films were fabricated on quartz glass substrate using spin coating technique with 2 molar of zinc oxide in organic solvent as starting materials. The fabricated sample was post-annealed at different temperature from 350 °C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5800b631ff0e794fcc5cc63050fae671
https://doi.org/10.1016/j.matpr.2017.06.097
https://doi.org/10.1016/j.matpr.2017.06.097
Publikováno v:
Journal of Materials Science and Chemical Engineering. :41-48
ZnO films were deposited on glass substrates by means of a metal organic decomposition (MOD) method. We investigated the effect of annealing temperature, time and the number of laminated layers on the film structure on the basis of X-ray diffraction
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7aa7f6379d92e1baabd078109e9e132e
https://doi.org/10.4236/msce.2014.211006
https://doi.org/10.4236/msce.2014.211006
Autor:
Yuichi Nakamura, Hasegawa Tatsuo, Takashi Matsumoto, Minoru Komatsu, Masaru Kamano, Nobutomo Uehara
Publikováno v:
IEEJ Transactions on Fundamentals and Materials. 131:628-634
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f716c962bb6c8b40b3cd6637311a9622
https://doi.org/10.1541/ieejfms.131.628
https://doi.org/10.1541/ieejfms.131.628
Publikováno v:
Journal of JSEE. 58:65-70
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ca7f905bf5a5f244ddbf3c2d5c61321
https://doi.org/10.4307/jsee.58.4_65
https://doi.org/10.4307/jsee.58.4_65
Publikováno v:
Nanotechnology. 16:S102-S106
Based on topographic images of the GaAs(110) surface obtained by non-contact atomic force microscopy (NC-AFM) with different tip–sample distances, we discuss the tip–sample distance dependence of the cantilever vibration amplitude and the tip-ind
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1de6253a8d2cb5cd8c080c98444da931
https://doi.org/10.1088/0957-4484/16/3/019
https://doi.org/10.1088/0957-4484/16/3/019
Publikováno v:
Czechoslovak Journal of Physics. 54:781-784
We have investigated the effects of chemical etching on Raman spectra of porous silicon. The as-anodized porous silicon consisted mainly of crystalline silicon, as indicated by the Raman spectra. The background in the spectrum was strong, indicating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c18476a92432c4279774947734e01ef3
https://doi.org/10.1023/b:cjop.0000038531.70434.dd
https://doi.org/10.1023/b:cjop.0000038531.70434.dd
Publikováno v:
Nanotechnology. 15:S97-S100
Tip–sample interactions are at the origin of atomic resolution in non-contact atomic force microscopy (NC-AFM) but also make it difficult to understand the meaning of atomic features observed as NC-AFM images. (110) surfaces of III–V semiconducto
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77f9a2698f6cf21e9e523c809baec3ba
https://doi.org/10.1088/0957-4484/15/2/020
https://doi.org/10.1088/0957-4484/15/2/020
Publikováno v:
MRS Proceedings. 638
We studied the effect of surface roughness of Si wafers on porous silicon by means of photoluminescence (PL), Fourier transformed infrared (FTIR) absorption and Raman spectroscopy. We prepared several kinds of Si wafers with a different surface rough
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::101255be5f3c6e6ce4b8ceb2c06b8f6c
https://doi.org/10.1557/proc-638-f5.28.1
https://doi.org/10.1557/proc-638-f5.28.1
Autor:
Tetsuya Yamazaki, Yasuo Tsutsumi, Nobutomo Uehara, Masato Ohmukai, Akiharu Kobayashi, Shinji Fujihara
Publikováno v:
MRS Proceedings. 560
We studied the effect of post-anodization chemical etching on porous silicon by means of photoluminescence (PL), Fourier transform infrared (FTIR) absorption and Raman spectroscopy. We performed these measurements with repeating etching and then obse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cbd7cf64b6d77439d6c735c9b43bd2a
https://doi.org/10.1557/proc-560-157
https://doi.org/10.1557/proc-560-157