Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Nobuto Ono"'
Autor:
Takafumi Kamio, Tianrui Feng, Lei Sha, Jun-Ichi Matsuda, Takashi Hosono, Souma Yamamoto, Shogo Katayama, Anna Kuwana, Haruo Kobayashi, Kouji Hirai, Akira Suzuki, Satoshi Yamada, Tomoyuki Kato, Ritsuko Kitakoga, Takeshi Shimamura, Gopal Adhikari, Nobuto Ono, Kazuhiro Miura, Shigeya Yamaguchi
Publikováno v:
2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee08144277a63010e40f4b3b8690fd2a
https://doi.org/10.1109/icce-asia57006.2022.9954818
https://doi.org/10.1109/icce-asia57006.2022.9954818
Autor:
Takashi Hosono, Takafumi Kamio, Souma Yamamoto, Jun-ichi Matsuda, Kouji Hirai, Shogo Katayama, Tianrui Feng, Anna Kuwana, Haruo Kobayashi, Akira Suzuki, Satoshi Yamada, Tomoyuki Kato, Ritsuko Kitakoga, Takeshi Shimamura, Gopal Adhikari, Nobuto Ono, Kazuhiro Miura
Publikováno v:
2021 International Conference on Electrical, Computer and Energy Technologies (ICECET).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a7435eddba2b5bbb8bc5821ad9b9980
https://doi.org/10.1109/icecet52533.2021.9698748
https://doi.org/10.1109/icecet52533.2021.9698748
Autor:
Dan Yao, Xuanyan Bai, Shogo Katayama, Anna Kuwana, Kazuyuki Kawauchi, Haruo Kobayashi, Kouji Hirai, Akira Suzuki, Satoshi Yamada, Tomoyuki Kato, Ritsuko Kitakoga, Takeshi Shimamura, Gopal Adhikari, Nobuto Ono, Kazuhiro Miura, Shigeya Yamaguchi
Publikováno v:
IEICE Electronics Express. 19:20220430-20220430
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d7488aa963cbb382cabe09508c2b6c9
https://doi.org/10.1587/elex.19.20220430
https://doi.org/10.1587/elex.19.20220430
Autor:
Anna Kuwana, Yudai Abe, Haruo Kobayashi, Nobukazu Tsukiji, Souma Yamamoto, Miura Kazuhiro, Takashi Ida, Todoroki Yukichi, Nobuto Ono, Akira Suzuki, Kuswan Isam Ebisawa, Yukiko Shibasaki, Kakinoki Toshihiko
Publikováno v:
ISOCC
This paper analyzes our proposed temperature-insensitive MOS reference current source. It uses a self-bias circuit with feedback configuration, which may cause the circuit instability. Its stability condition has been investigated based on feedback t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::799af7af1842fe9e4e21c2f70884e555
https://doi.org/10.1109/isocc50952.2020.9332805
https://doi.org/10.1109/isocc50952.2020.9332805
Publikováno v:
ICPS
Beat Sensors have been attractive IoT sensor for their low power operations. This paper demonstrates Beat sensor operates for longer durations powered by coin batteries than conventional IoT sensors with intermittent operations. In experiments using
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48ae294b2f51e2b7c00c7e1c2aaa4479
https://doi.org/10.1109/icphys.2019.8780159
https://doi.org/10.1109/icphys.2019.8780159
Autor:
Takashi Sato, Hiroo Masuda, Tsuyoshi Sakata, Takaaki Okumura, Toshiki Kanamoto, Nobuto Ono, Hidenari Nakashima, Masanori Hashimoto, Atsushi Kurokawa, Hiroshi Takafuji
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :990-997
SUMMARY Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::801907e091e541b52a368d0907346707
https://doi.org/10.1587/transfun.e92.a.990
https://doi.org/10.1587/transfun.e92.a.990
Autor:
Nobuto Ono, Hiroyuki Kobayashi, Takaaki Okumura, Jiro Iwai, Hidenari Nakashima, Takashi Sato, Masanori Hashimoto
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :808-814
With the recent advance of process technology shrinking, process parameter variation has become one of the major issues in SoC designs, especially for timing convergence. Recently, Statistical Static Timing Analysis (SSTA) has been proposed as a prom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b18fd663ec85b27005ff82573521491
https://doi.org/10.1093/ietfec/e90-a.4.808
https://doi.org/10.1093/ietfec/e90-a.4.808
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :3491-3499
In this paper, we propose a methodology for calculating on-chip temperature gradient and leakage power distributions. It considers the interdependence between leakage power and local temperature using a general circuit simulator as a differential equ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97e3944b7cbdad8ffdc3fb6cfbedc4e3
https://doi.org/10.1093/ietfec/e89-a.12.3491
https://doi.org/10.1093/ietfec/e89-a.12.3491
Publikováno v:
SPIE Proceedings.
Flat panel display (fpd) design needs further improving of design quality and efficiency due to aggressive market needs like fast growing 3d panel, big screen for tv. In this paper, we explain the specialized verification technology for panel layout,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8854cd83ad9679c82a80bd1a124bc69
https://doi.org/10.1117/12.981996
https://doi.org/10.1117/12.981996
Publikováno v:
ASP-DAC
This paper quantitatively analyzes thermal gradient of SoC and proposes a thermal flattening procedure. First, the impact of dominant parameters, such as area occupancy of memory/logic block, power density, and floorplan on thermal gradient are studi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e78a4a7e7bbacb553a909054711b1043
https://doi.org/10.1109/aspdac.2005.1466526
https://doi.org/10.1109/aspdac.2005.1466526