Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Noboru Schibuya"'
A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance
Publikováno v:
IEICE Transactions on Communications. :1338-1343
In this research, the performance degradation of the digital electronic equipment under electromagnetic (EM) disturbance was studied in order to investigate the interference of intra-equipment. To develop the evaluation method of the performance degr
Autor:
Noboru Schibuya, Takehiro Takahashi, Atsushi Yoshida, A. Mutoh, Shuichi Nitta, Takashi Sakusabe
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 10:73-79
The receiving characteristics of electromagnetic interference on the power-ground line of an inverter IC—in other words, its electromagnetic susceptibility—was measured to investigate the dependence of susceptibility on the operating condition of
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 6:516-519
New measurement method for characteristic impedance of Printed Circuit Board was developed and its usability was demonstrated. This method is based on a conventional TDR method, but using burst sinusoidal wave modulated by step pulse as a input signa
Autor:
Noboru Schibuya, Takehiro Takahashi
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 123:1192-1195
The EMC simulation is now widely used in design stage of electronic equipment to reduce electromagnetic noise. As the calculated electromagnetic behaviors of the EMC simulator depends on the inputted EMC model of the equipment, the modeling technique
Autor:
Noboru Schibuya, Takehiro Takahashi
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 4:354-359
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 2:526-530
Autor:
Noboru Schibuya, Takehiro Takahashi
Publikováno v:
The Journal of Japan Institute for Interconnecting and Packaging Electronic Circuits. 12:315-320
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 115:1181-1188
Autor:
Satoru Maruyama, Kenichi Ito, Yuji Tarui, Yoshiki Koyanagi, Noboru Schibuya, Takehiro Takahashi
Publikováno v:
Circuit Technology. 9:37-43
Autor:
Hidetaka Hayashi, Noboru Schibuya
Publikováno v:
Circuit Technology. 9:65-69