Zobrazeno 1 - 1
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pro vyhledávání: '"Noam Oved"'
Autor:
Taekwon Jee, Joonsang You, Hong-Goo Lee, Sang-Ho Lee, Seungmo Hong, Jaewook Seo, Roi Meir, Noam Oved, Jun Park, Shin-Ik Kim, Byung-Jo Lim, Chan-Hee Kwak, Jeong-Ho Yeo
Publikováno v:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0309de5f3ae1e89e68cfb2257c85e3e2
https://doi.org/10.1109/edtm55494.2023.10102957
https://doi.org/10.1109/edtm55494.2023.10102957
