Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Noack MA"'
Publikováno v:
E3S Web of Conferences, Vol 40, p 03030 (2018)
This study presents an experimental approach to investigate cohesive reservoir sediments. It is shown, how adjacent sediment cores can be extracted from reservoir beds with a Frahm Sediment Sampler. The cores are subsequently used for detailed invest
Externí odkaz:
https://doaj.org/article/ce0678fcab7a4626beb16cb4fd9157b3
Publikováno v:
MATEC Web of Conferences, Vol 246, p 01002 (2018)
To investigate the erosion stability of reservoir sediments, two measuring strategies were applied. Next to in situ measurements, sediment cores were extracted and analysed in the laboratory. At several sampling points at a reservoir in Germany, the
Externí odkaz:
https://doaj.org/article/356fbc5c5b7846f8a6f8ef24045ac2e8
Publikováno v:
E3S Web of Conferences, Vol 9, p 09011 (2016)
Tensile failure in unsaturated cohesive soils during desiccation is important for the design of geotechnical applications such as capping systems of landfills and sealing material of dikes. This study presents the results of different initial paramet
Externí odkaz:
https://doaj.org/article/63090487f94a4cd09cd53adb2d50c3e2
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Koliyadu JCP; European XFEL GmbH, Schenefeld, Germany., Moško D; University of P. J. Šafárik, Kosice, Slovakia., Asimakopoulou EM; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Bellucci V; European XFEL GmbH, Schenefeld, Germany., Birnšteinová Š; European XFEL GmbH, Schenefeld, Germany., Bean R; European XFEL GmbH, Schenefeld, Germany., Letrun R; European XFEL GmbH, Schenefeld, Germany., Kim C; European XFEL GmbH, Schenefeld, Germany., Kirkwood H; European XFEL GmbH, Schenefeld, Germany., Giovanetti G; European XFEL GmbH, Schenefeld, Germany., Jardon N; European XFEL GmbH, Schenefeld, Germany., Szuba J; European XFEL GmbH, Schenefeld, Germany., Guest T; European XFEL GmbH, Schenefeld, Germany., Koch A; European XFEL GmbH, Schenefeld, Germany., Grünert J; European XFEL GmbH, Schenefeld, Germany., Szeles P; University of P. J. Šafárik, Kosice, Slovakia., Villanueva-Perez P; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Reuter F; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Ohl CD; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Noack MA; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Garcia-Moreno F; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Kuglerová-Valdová Z; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Juha L; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Nikl M; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Yashiro W; International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Soyama H; Department of Finemechanics, Tohoku University, 6-6-01 Aramaki, Aoba-ku, Sendai 980-8579, Japan., Eakins D; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Korsunsky AM; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Uličný J; University of P. J. Šafárik, Kosice, Slovakia., Meents A; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Chapman HN; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Mancuso AP; European XFEL GmbH, Schenefeld, Germany., Sato T; European XFEL GmbH, Schenefeld, Germany., Vagovič P; European XFEL GmbH, Schenefeld, Germany.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2025 Jan 01. Date of Electronic Publication: 2025 Jan 01.
Autor:
García-Moreno F; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Kamm PH; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Neu TR; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Bülk F; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Noack MA; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Wegener M; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., von der Eltz N; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Schlepütz CM; Swiss Light Source, Paul Scherrer Institute, Forschungsstr. 111, Villigen, 5232, Switzerland., Stampanoni M; Swiss Light Source, Paul Scherrer Institute, Forschungsstr. 111, Villigen, 5232, Switzerland.; Institute for Biomedical Engineering, ETH Zürich, Gloriastrasse 35, Zürich, 8092, Switzerland., Banhart J; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2021 Nov; Vol. 33 (45), pp. e2104659. Date of Electronic Publication: 2021 Sep 23.
Autor:
Chen Y; Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA., Elshobaki M, Ye Z, Park JM, Noack MA, Ho KM, Chaudhary S
Publikováno v:
Physical chemistry chemical physics : PCCP [Phys Chem Chem Phys] 2013 Mar 28; Vol. 15 (12), pp. 4297-302.