Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Noack MA"'
Autor:
Koliyadu JCP; European XFEL GmbH, Schenefeld, Germany., Moško D; University of P. J. Šafárik, Kosice, Slovakia., Asimakopoulou EM; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Bellucci V; European XFEL GmbH, Schenefeld, Germany., Birnšteinová Š; European XFEL GmbH, Schenefeld, Germany., Bean R; European XFEL GmbH, Schenefeld, Germany., Letrun R; European XFEL GmbH, Schenefeld, Germany., Kim C; European XFEL GmbH, Schenefeld, Germany., Kirkwood H; European XFEL GmbH, Schenefeld, Germany., Giovanetti G; European XFEL GmbH, Schenefeld, Germany., Jardon N; European XFEL GmbH, Schenefeld, Germany., Szuba J; European XFEL GmbH, Schenefeld, Germany., Guest T; European XFEL GmbH, Schenefeld, Germany., Koch A; European XFEL GmbH, Schenefeld, Germany., Grünert J; European XFEL GmbH, Schenefeld, Germany., Szeles P; University of P. J. Šafárik, Kosice, Slovakia., Villanueva-Perez P; Synchrotron Radiation Research and NanoLund, Lund University, Sweden., Reuter F; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Ohl CD; Faculty of Natural Sciences, Institute for Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg, Germany., Noack MA; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Garcia-Moreno F; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany., Kuglerová-Valdová Z; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Juha L; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Nikl M; FZU - Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic., Yashiro W; International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Soyama H; Department of Finemechanics, Tohoku University, 6-6-01 Aramaki, Aoba-ku, Sendai 980-8579, Japan., Eakins D; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Korsunsky AM; Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, United Kingdom., Uličný J; University of P. J. Šafárik, Kosice, Slovakia., Meents A; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Chapman HN; Center for Free-Electron Laser Science (CFEL), Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany., Mancuso AP; European XFEL GmbH, Schenefeld, Germany., Sato T; European XFEL GmbH, Schenefeld, Germany., Vagovič P; European XFEL GmbH, Schenefeld, Germany.
Publikováno v:
Journal of synchrotron radiation [J Synchrotron Radiat] 2025 Jan 01. Date of Electronic Publication: 2025 Jan 01.
Autor:
García-Moreno F; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Kamm PH; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Neu TR; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Bülk F; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Noack MA; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Wegener M; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., von der Eltz N; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany., Schlepütz CM; Swiss Light Source, Paul Scherrer Institute, Forschungsstr. 111, Villigen, 5232, Switzerland., Stampanoni M; Swiss Light Source, Paul Scherrer Institute, Forschungsstr. 111, Villigen, 5232, Switzerland.; Institute for Biomedical Engineering, ETH Zürich, Gloriastrasse 35, Zürich, 8092, Switzerland., Banhart J; Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, 14109, Germany.; Institute of Materials Science and Technology, Technische Universität Berlin, Hardenbergstr. 36, Berlin, 10623, Germany.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2021 Nov; Vol. 33 (45), pp. e2104659. Date of Electronic Publication: 2021 Sep 23.
Autor:
Chen Y; Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA., Elshobaki M, Ye Z, Park JM, Noack MA, Ho KM, Chaudhary S
Publikováno v:
Physical chemistry chemical physics : PCCP [Phys Chem Chem Phys] 2013 Mar 28; Vol. 15 (12), pp. 4297-302.
Publikováno v:
Journal of Mathematical Imaging & Vision; Jun2024, Vol. 66 Issue 3, p380-392, 13p
Akademický článek
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Autor:
Noack, Amélie1 (AUTHOR) amelienoac@aol.com
Publikováno v:
Psychodynamic Practice. Feb2021, Vol. 27 Issue 1, p112-115. 4p.
Autor:
McCoy, Dakota E., McCoy, Victoria E., Mandsberg, Nikolaj K., Shneidman, Anna V., Aizenberg, Joanna, Prum, Richard O., Haig, David
Publikováno v:
Proceedings of the Royal Society B: Biological Sciences; 5/1/2019, Vol. 286 Issue 1902, p1-9, 9p
Autor:
Noack, Amélie
Publikováno v:
Group Analysis; Jun2018, Vol. 51 Issue 2, p238-245, 8p
Publikováno v:
Journal of Physics D: Applied Physics; 6/1/1977, Vol. 10 Issue 8, p1-1, 1p
Autor:
Earl Hopper, Haim Weinberg
The social unconscious is vital for understanding persons and their groupings, ranging from families to societies, committees to organisations, and from small to median to large therapeutic groups, and essential for comprehensive clinical work. This