Zobrazeno 1 - 1
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pro vyhledávání: '"Nitish Kulshrestha"'
Publikováno v:
2018 International Conference on Smart City and Emerging Technology (ICSCET).
Any electronic device is prone to degradation and damage due to operational as well as environmental causes. For capacitors, a prominent cause is switching action in filters. Under a stable switching supply, the stress observed is not due to peak vol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e31c725a6127557fa5d2997eff966878
https://doi.org/10.1109/icscet.2018.8537380
https://doi.org/10.1109/icscet.2018.8537380
