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of 100
pro vyhledávání: '"Nishimura, Takuma"'
Scanning Electron Microscopes (SEMs) are widely renowned for their ability to analyze the surface structures of microscopic objects, offering the capability to capture highly detailed, yet only grayscale, images. To create more expressive and realist
Externí odkaz:
http://arxiv.org/abs/2410.21310
Autor:
Nishimura, Takuma1 (AUTHOR) t-nishimura@fcu.ac.jp
Publikováno v:
Japanese Psychological Research. Apr2024, Vol. 66 Issue 2, p138-153. 16p.
Autor:
Ishida, Akihiko, Nishimura, Takuma, Koyama, Kaito, Maeki, Masatoshi, Tani, Hirofumi, Tokeshi, Manabu
Publikováno v:
In Journal of Chromatography A 13 September 2023 1706
Autor:
Yamamoto, Kazuhiro1 (AUTHOR), Nishimura, Takuma1 (AUTHOR), Machida, Koichi1 (AUTHOR), Kotani, Akira1 (AUTHOR), Hakamata, Hideki1 (AUTHOR) hakaman@toyaku.ac.jp
Publikováno v:
Journal of Separation Science. May2022, Vol. 45 Issue 10, p1797-1805. 9p.
Autor:
Nishimura, Takuma, Sakurai, Shigeo
Publikováno v:
In Journal of Applied Developmental Psychology January-February 2017 48:42-48
Autor:
Nishimura, Takuma, Suzuki, Takashi
Publikováno v:
In Personality and Individual Differences July 2016 97:300-305
Improvement of electric insulation in dielectric layered perovskite nickelate films via fluorination
Publikováno v:
Journal of materials chemistry C. 10(5):1711-1717
Layered perovskite nickelates have recently emerged as materials with colossal dielectric permittivity. However, they exhibit relatively high values of loss tangent (tan delta) owing to insufficient electric insulation; thus, lowering of tan delta is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::e4e205520c1337f1d63748dfda836fe2
http://hdl.handle.net/2115/87957
http://hdl.handle.net/2115/87957
Autor:
Nishimura, Takuma1,2 (AUTHOR) nishimura.takuma@kochi-tech.ac.jp, Bradshaw, Emma L.3 (AUTHOR), Deci, Edward L.2,4 (AUTHOR), Ryan, Richard M.3 (AUTHOR)
Publikováno v:
Social Development. Feb2021, Vol. 30 Issue 1, p293-310. 18p. 1 Diagram, 5 Charts.