Výsledky vyhledávání - "Nishii, Koji"

State-of-the-Art Study on Mitigation Techniques of Single Event Effects in Terrestrial Applications

Autor: Ibe, Eishi, Shimbo, Kenichi, Toba, Tadanobu, Taniguchi, Hitoshi, Uezono, Takumi, Nishii, Koji, Taniguchi, Yoshio

Publikováno v: 宇宙航空研究開発機構特別資料 = JAXA Special Publication. :148-154

As semiconductor device scaling is on-going far below 100nm design rule, terrestrial neutron-induced soft-error typically in CMOS devices is predicted to be worsen furthermore. Moreover, novel failure modes that may be more serious than those in memo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=jairo_______::c9155e3d780a4c6a0da09b1722a3c7f7
http://id.nii.ac.jp/1696/00004320/

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Akademický článek

Ozonization of amides.

Autor: Imamura, Sei-Ichiro, Nishii, Koji, Teranishi, Hiroshi

Publikováno v: Journal of Applied Polymer Science; Apr1982, Vol. 27 Issue 4, p1413-1415, 3p

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