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Autor:
Frederik Vanmeert, Steven De Meyer, Arthur Gestels, Ermanno Avranovich Clerici, Nina Deleu, Stijn Legrand, Piet Van Espen, Geert Van der Snickt, Matthias Alfeld, Joris Dik, Letizia Monico, Wout De Nolf, Marine Cotte, Victor Gonzalez, Steven Saverwyns, Livia Depuydt-Elbaum, Koen Janssens
Publikováno v:
Analytical chemistry for the study of paintings and the detection of forgeries / Colombini, M.P. [edit.]; et al. [edit.]
Analytical Chemistry for the Study of Paintings and the Detection of Forgeries ISBN: 9783030868642
Analytical Chemistry for the Study of Paintings and the Detection of Forgeries ISBN: 9783030868642
Recent studies in which X-ray beams of (sub)micrometre to millimetre dimensions have been used for non-destructive analysis and characterization of pigments, minute paint samples and/or entire paintings from fifteenth to twentieth century artists are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6dbcd37ac1252a909153754bbfd453cb
https://hdl.handle.net/10067/1907770151162165141
https://hdl.handle.net/10067/1907770151162165141