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pro vyhledávání: '"Nimbalkar, Saee"'
Autor:
Kumbhar, Arti, Chougule, Amruta, Lokhande, Priya, Navaghane, Saloni, Burud, Aditi, Nimbalkar, Saee
Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in precisely ident
Externí odkaz:
http://arxiv.org/abs/2311.03725
