Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Nima Mozaffari"'
Autor:
Saeed Azizi, Ramin Mazaheri‐Khameneh, Farshid Davoodi, Mohammad Mahdi Gooran, Seyed Siavash Ghoreishi, Nima Mozaffari, Bahram Dalir‐Naghadeh
Publikováno v:
Veterinary Medicine and Science, Vol 10, Iss 4, Pp n/a-n/a (2024)
In this case report, we present an unusual clockwise torsion of left colon around mesenteric root in a 10‐month‐old Arab filly, highlighting the clinical presentation, diagnostic approach and successful surgical intervention. A 10‐month‐old A
Externí odkaz:
https://doaj.org/article/9d1c644c22f642f282ec43164f0f9853
Publikováno v:
2022 8th Iranian Conference on Signal Processing and Intelligent Systems (ICSPIS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f7be313862c734dbfdd64f4efd1d2a5
https://doi.org/10.1109/icspis56952.2022.10043905
https://doi.org/10.1109/icspis56952.2022.10043905
Autor:
Bonita Bhaskaran, Sanmitra Banerjee, Kaushik Narayanun, Shao-Chun Hung, Seyed Nima Mozaffari Mojaveri, Mengyun Liu, Gang Chen, Tung-Che Liang
Publikováno v:
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3be275da2e1de370a86aba1441bc82db
https://doi.org/10.1145/3508352.3561122
https://doi.org/10.1145/3508352.3561122
Autor:
Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas Satheesh, Kuo Lin Fu, Nithin Valentine, P Manikandan, Mahmut Yilmaz
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77e2fdc2b9ec8be94bbdcc49ce9d405d
https://doi.org/10.1109/vts52500.2021.9794251
https://doi.org/10.1109/vts52500.2021.9794251
Publikováno v:
IEEE Transactions on Nanotechnology. 18:866-878
Memristive Crossbar Arrays (MCAs) are widely used in designing fast and compact neuromorphic systems. However, such systems require on-chip implementation of the backpropagation algorithm to accommodate process variations. This paper proposes a low h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3374d8292c399ec5041a282be7b9c78
https://doi.org/10.1109/tnano.2019.2933806
https://doi.org/10.1109/tnano.2019.2933806
Publikováno v:
IEEE Transactions on Nanotechnology. 17:1206-1216
Ternary Content Addressable Memory (TCAM) is used in applications that require a low power dissipation and fast data retrieval. This paper presents a domain wall-based spintronic TCAM cell. The proposed design exploits the resistive behavior of this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ad0131ea158e5b555e85d4c1d08a3b7
https://doi.org/10.1109/tnano.2018.2869734
https://doi.org/10.1109/tnano.2018.2869734
Autor:
Seyed Nima Mozaffari, Spyros Tragoudas
Publikováno v:
IEEE Transactions on Nanotechnology. 17:897-905
A new method to implement threshold logic functions using memristors is presented. This method benefits from the high range of memristor's resistivity, which is used to define different weight values, and reduces significantly the transistor count. W
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b064406f4028d536aed0099aa0c96e8d
https://doi.org/10.1109/tnano.2018.2822285
https://doi.org/10.1109/tnano.2018.2822285
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 65:946-959
An integer linear programming-based framework to identify the current-mode threshold logic functions is presented. The approach minimizes the transistor count and benefits from a generalized definition of threshold logic functions. It is shown that t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::676fd02cd1a744eccc9eb2ed2a24f693
https://doi.org/10.1109/tcsi.2017.2768563
https://doi.org/10.1109/tcsi.2017.2768563
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36:1018-1029
Resistive memory is a promising emerging technology but is prone to defects due to uncertainties in nanoscale fabrication. The test time of existing techniques for bipolar metal–oxide memristors is dominated by slow writes. Fast March tests are pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ccd2349b548c6f0884c6fd60637dc03
https://doi.org/10.1109/tcad.2016.2608863
https://doi.org/10.1109/tcad.2016.2608863
Autor:
Jonathon E. Colburn, Seyed Nima Mozaffari, Kaushik Narayanun, Shantanu Sarangi, Vinod Pagalone, Ayub Abdollahian, Bonita Bhaskaran
Publikováno v:
ITC
The Power Distribution Network (PDN) is designed for worst-case power-hungry functional use-cases. Most often Design for Test (DFT) scenarios are not accounted for, while optimizing the PDN design. Automatic Test Pattern Generation (ATPG) tools typic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62242e94db505e1ce83da9759385bb1f
https://doi.org/10.1109/itc44170.2019.9000171
https://doi.org/10.1109/itc44170.2019.9000171