Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Nikolay N. Samotaev"'
Proton- and Neutron-Induced SEU Cross-Section Modeling and Simulation: A Unified Analytical Approach
Autor:
Gennady I. Zebrev, Nikolay N. Samotaev, Rustem G. Useinov, Artur M. Galimov, Vladimir V. Emeliyanov, Artyom A. Sharapov, Dmitri A. Kazyakin, Alexander S. Rodin
Publikováno v:
Radiation, Vol 4, Iss 1, Pp 37-49 (2024)
A new physics-based compact model, which makes it possible to simulate in a unified way the neutrons and protons of cosmic ray-induced SEU cross-sections, including the effects from nuclear reaction products and from direct ionization by low-energy p
Externí odkaz:
https://doaj.org/article/9d0bfed7d313493dbcb23cb4dbe73ed5
Publikováno v:
Proceedings, Vol 1, Iss 4, p 617 (2017)
In this work we present the results on the application of additive technology that is aerosol and ink jet technique for the fabrication of high-temperature metal oxide gas sensors. The application of thin (12 μm) alumina membrane, aerosol jet printi
Externí odkaz:
https://doaj.org/article/52eccdec00c746b0840ec39e61e5d78f
Autor:
Alexey A. Vasiliev, Anton V. Nisan, Gleb N. Potapov, Nikolay N. Samotaev, Konstantin Yu. Oblov, Anastasia V. Ivanova
Publikováno v:
Proceedings, Vol 1, Iss 4, p 324 (2017)
The application of thin LTCC is a very interesting and promising approach to the fabrication of ceramic MEMS gas sensors. The attempts to use this material were restricted till now by the thickness of commercial material (>50 μm). In this work, we f
Externí odkaz:
https://doaj.org/article/27913c71c77e47e5addcfe0b3e0f185b
Autor:
Andrey V. Kaziev, Dobrynya V. Kolodko, Vladislav Yu. Lisenkov, Alexander V. Tumarkin, Maksim M. Kharkov, Nikolay N. Samotaev, Konstantin Yu. Oblov
Publikováno v:
Coatings; Volume 13; Issue 2; Pages: 238
We examined the feasibility of alumina substrate metallization by magnetron deposition of copper coatings with thickness of several tens µm for its prospective applications in production of ceramic PCBs and packaging. The films were prepared in magn
Autor:
Samotaev N; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Podlepetsky B; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Mashinin M; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Ivanov I; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Obraztsov I; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Oblov K; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Dzhumaev P; Institute of Nanoengineering in Electronics, Spintronics and Photonics, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia.
Publikováno v:
Micromachines [Micromachines (Basel)] 2024 Jan 16; Vol. 15 (1). Date of Electronic Publication: 2024 Jan 16.
Autor:
Litvinov A; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Etrekova M; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Podlepetsky B; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Samotaev N; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Oblov K; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Afanasyev A; Engineering Center of Microtechnology and Diagnostics, St. Petersburg Electrotechnical University (ETU «LETI»), Professora Popova str. 5, 197022 St. Petersburg, Russia., Ilyin V; Engineering Center of Microtechnology and Diagnostics, St. Petersburg Electrotechnical University (ETU «LETI»), Professora Popova str. 5, 197022 St. Petersburg, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Apr 05; Vol. 23 (7). Date of Electronic Publication: 2023 Apr 05.
Autor:
Podlepetsky B; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Samotaev N; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Etrekova M; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Litvinov A; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Mar 20; Vol. 23 (6). Date of Electronic Publication: 2023 Mar 20.
Autor:
Samotaev N; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Litvinov A; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Oblov K; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Etrekova M; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Podlepetsky B; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia., Dzhumaev P; Micro- and Nanoelectronics Department, National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe Highway 31, 115409 Moscow, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Jan 03; Vol. 23 (1). Date of Electronic Publication: 2023 Jan 03.
Autor:
Samotaev N; Micro and Nanoelectronics Department, MEPhI (Moscow Engineering Physics Institute), National Research Nuclear University, 115409 Moscow, Russia., Oblov K; Micro and Nanoelectronics Department, MEPhI (Moscow Engineering Physics Institute), National Research Nuclear University, 115409 Moscow, Russia., Dzhumaev P; Micro and Nanoelectronics Department, MEPhI (Moscow Engineering Physics Institute), National Research Nuclear University, 115409 Moscow, Russia., Fritsch M; Fraunhofer IKTS Institute, 01277 Dresden, Germany., Mosch S; Fraunhofer IKTS Institute, 01277 Dresden, Germany., Vinnichenko M; Fraunhofer IKTS Institute, 01277 Dresden, Germany., Trofimenko N; Fraunhofer IKTS Institute, 01277 Dresden, Germany., Baumgärtner C; Fraunhofer IKTS Institute, 01277 Dresden, Germany., Fuchs FM; KERAFOL Keramische Folien GmbH & Co. KG, 92676 Eschenbach, Germany., Wissmeier L; KERAFOL Keramische Folien GmbH & Co. KG, 92676 Eschenbach, Germany.
Publikováno v:
Micromachines [Micromachines (Basel)] 2021 Nov 25; Vol. 12 (12). Date of Electronic Publication: 2021 Nov 25.
Autor:
Samotaev N; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe hwy 31, 115409 Moscow, Russia., Litvinov A; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe hwy 31, 115409 Moscow, Russia., Etrekova M; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe hwy 31, 115409 Moscow, Russia.; 'INKRAM' LLC Research and Production Company ('Inkram' RPC LLC), Mikhalkovskaya Street 63 'Б', Bldg. 1, Floor 3, Premise VII, 125438 Moscow, Russia., Oblov K; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe hwy 31, 115409 Moscow, Russia., Filipchuk D; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe hwy 31, 115409 Moscow, Russia.; 'INKRAM' LLC Research and Production Company ('Inkram' RPC LLC), Mikhalkovskaya Street 63 'Б', Bldg. 1, Floor 3, Premise VII, 125438 Moscow, Russia., Mikhailov A; 'INKRAM' LLC Research and Production Company ('Inkram' RPC LLC), Mikhalkovskaya Street 63 'Б', Bldg. 1, Floor 3, Premise VII, 125438 Moscow, Russia.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2020 Mar 10; Vol. 20 (5). Date of Electronic Publication: 2020 Mar 10.